Dept. of Comput. Sci. Eng., Texas AM Univ., College station, TX, USA;
interference suppression; power supplies to apparatus; EDT; PSN control algorithm; compression constraints; embedded deterministic test; power supply noise control; test compression; Decision support systems; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Very large scale integration; power supply noise; test compaction/compression;
机译:NIM-X:一种基于噪声指数模型的X填充技术,可克服电源开关噪声对路径延迟测试的影响
机译:电源噪声:原因,影响和测试
机译:降低线性降压环境中全速扫描测试的电源噪声
机译:测试压缩对电源噪声控制的影响
机译:VLSI电路扫描测试中的低成本电源和电源噪声估计与控制
机译:论卫生部门提高牛奶供应控制权的重要性
机译:考虑电源噪声影响的小延迟缺陷的伪功能测试