Validation of the component degradation simulation tool (CODES)

摘要

SEE mechanisms in modern technologies radiation have increasing complexity. This paper reviews CODES and SVFIT (Sensitive Volume Fit) models, which have been developed to evaluate device sensitivity to radiation and predict SEU rates. These models are the object of an engineering tool that is currently under development. The models are based on the Geant4 radiation transport program combined with irradiation test data. For models validation the Reference SEU Monitor (RSEUM) has been fully simulated. The models allow a very good reconstruction of SEU cross-section curves for ions and protons based on ion test data simulation. The description of direct and indirect ionization profiles at the RSEUM sensitive volume for all particles and energies is presented. This paper describes the models, the overall framework and some of the most relevant results.