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12th European Conference on Radiation and Its Effects on Components and Systems

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1.Perspectives for provision of high quality space radiation environment data using the Energetic Particle Telescope (EPT)

机译：使用高能粒子望远镜（EPT）提供高质量空间辐射环境数据的观点
- 作者：Cyamukungu Mathias;Benck Sylvie;Cabrera Juan;Gregoire Ghislain;Bonnewijn Sabrina;Maes Jeroen;Van Ransbeeck Emiel;Creve Glenn;De Saedeleer Jurgen;Desoete Bart;Semaille Christophe;Valtonen Eino;Punkkinen Risto;Nieminen Petteri;Menicucci Aless
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- EPT;
- Energetic Particle Telescope;
- Radiation Monitor;
- Space Radiation;
2.Influence of spacecraft shielding structures on Galactic Cosmic ray-induced soft error rate

机译：航天器屏蔽结构对银河系宇宙射线诱发的软错误率的影响
- 作者：Silvestri Marco;Tracino Emanuele;Destefanis Roberto;Lobascio Cesare;Santin Giovanni;Calvel Philippe
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- GCR;
- MOS;
- Radiation effects;
- Shielding;
- Single Event Effects;
- Soft Error Rate;
- galactic cosmic rays;
3.PROBA-II Technology Demonstration Module in-flight data analysis

机译：PROBA-II技术演示模块飞行中数据分析
- 作者：Harboe-Sorensen R.;Poivey C.;Zadeh A.;Keating A.;Fleurinck N.;Puimege K.;Guerre F.-X.;Lochon F.;Kaddour M.;Li L.;Walter D.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
4.Hardening techniques for MRAM-based non-volatile storage cells and logic

机译：基于MRAM的非易失性存储单元的硬化技术和逻辑
- 作者：Lakys Y.;Zhao W.S.;Klein J-O.;Chappert C.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- MRAM;
- Multi-context;
- Non-Volatile;
- Radiation Hardness by Design;
- SEU;
- Spintronics;
5.SET and SEU simulation toolkit for LabVIEW

机译：用于LabVIEW的SET和SEU仿真工具包
- 作者：Bartra Walter Calienes;Reis Ricardo
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Fault;
- LabVIEW;
- Microelectronics;
- SET;
- SEU;
- Simulation;
6.Degradation of the output electrical Characteristics of Si solar cells as a result of ionizing radiation under low light conditions

机译：弱光条件下电离辐射导致Si太阳能电池的输出电性能下降
- 作者：Stojanovic N.;Osmokrovic P.;Stojanovic M.;Milosavljevic M.;Stamenic Lj.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Electrical Characteristics;
- Radiation Effects;
- Solar cells;
7.Characterizing, modeling, and simulating soft error susceptibility in cell-based designs in highly scaled technologies

机译：在大规模技术中基于单元的设计中表征，建模和模拟软错误敏感性
- 作者：Li Y. F.;Li M.;Zhao J. Y.;Schrimpf R. D.;Fleetwood D. M.;Zhang B.;Wang J. Q.;Wang D. L.;Wang Y.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Pulse broadening;
- Single Event Transient (SET);
- Soft Error Rate (SER);
8.A compact model for Single Event Effects in PD SOI sub-micron MOSFETs

机译：PD SOI亚微米MOSFET中单事件效应的紧凑模型
- 作者：Alvarado J.;Kilchytska V.;Boufouss E.;Flandre D.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Circuit and device simulation;
- Single Event Effects;
- compact;
- silicon on insulator;
9.Implementing realistic heavy ion tracks in a SEE prediction tool: Comparison between different approaches

机译：在SEE预测工具中实现逼真的重离子轨迹：不同方法之间的比较
- 作者：Raine Melanie;Hubert Guillaume;Paillet Philippe;Gaillardin Marc;Bournel Arnaud
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Geant4;
- Heavy ion;
- SEE prediction;
- SRAM;
10.A three-dimensional FPGA array beam detector for ionizing radiation experiments

机译：用于电离辐射实验的三维FPGA阵列束检测器
- 作者：Gebelein Jano;Kebschull Udo
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
11.Conceptual design of the proton irradiation facility for space radiation testing at ESSBilbao

机译：ESS毕尔巴鄂用于空间辐射测试的质子辐照设备的概念设计
- 作者：Abad E.;Huerta M.;Martinez R.;Martínez R.;Etxebarria V.;Portilla J.;Bermejo F.J.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Proton linear accelerator;
- radiation effects;
- radiation tests;
12.Neutronic applications laboratory for ESS-Bilbao

机译：ESS的中子学应用实验室-毕尔巴鄂
- 作者：Terron S.;Magan M.;Ghiglino A.;Martinez F.;Sordo F.;Perlado J.M.;Bermejo F.J.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
13.The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components

机译：在ITEP中使用高能离子同步加速器对现代电子元件进行SEE测试
- 作者：Zinchenko V. F.;Lavrentjev K. V.;Lipsky A. K.;Ulimov V. N.;Alexejev N. N.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Linear energy transfer;
- high-energy ions;
- integrated circuit;
- sensitive volume;
- single event effects;
- straggling;
14.Initial measurements on Pixel Detector modules for the ATLAS upgrades

机译：用于ATLAS升级的Pixel Detector模块的初始测量
- 作者：Gallrapp Christian
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- ATLAS upgrade;
- Diamond sensors;
- Pixel Detector;
- Radiation hardness;
- Silicon sensors;
15.Using RADFETs for alpha radiation dosimetry

机译：使用RADFET进行α辐射剂量测定
- 作者：Sharp R. E.;Hofman J.;Holmes-Siedle A.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- RADFET;
- alpha radiation;
- dosimetry;
- ion implantation;
16.Highly radiation sensitive Type IA FBGs for dosimetry applications

机译：高度辐射敏感的IA型FBG，用于剂量测定应用
- 作者：Faustov A.;Saffari P.;Koutsides C.;Gusarov A.;Wuilpart M.;Megret P.;Kalli K.;Zhang L.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Fiber Bragg gratings;
- fiber optic dosimetry;
- ionizing radiation effects;
17.A new irradiation facility for neutron-induced Single Event Effect studies at LNL

机译：用于LNL中子诱发单事件效应研究的新辐照设施
- 作者：Bisello Dario;Candelori Andrea;Dzysiuk Natalia;Esposito Juan;Mastinu Pierfrancesco;Mattiazzo Serena;Prete Gianfranco;Silvestrin Luca;Wyss Jeffery
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Single Event Effects;
- irradiation facility;
- neutron radiation effects;
18.Imaging the Single Event Burnout sensitive volume of vertical power MOSFETs using the laser Two-Photon Absorption technique

机译：使用激光双光子吸收技术对垂直功率MOSFET的单事件烧坏敏感体积进行成像
- 作者：Darracq F.;Mbaye N.;Larue C.;Pouget V.;Azzopardi S.;Lorfevre E.;Bezerra F.;Lewis D.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Sensitive volume;
- Single Event Burnout;
- Two Photon Absorption;
- vertical power MOSFET;
19.SEGR characterization of power MOSFETs: A new insight on PIGST associated to a non-destructive charge collection measurement tool

机译：功率MOSFET的SEGR表征：与无损电荷收集测量工具相关的PIGST的新见解
- 作者：Carvalho A. M. J. F.;Binois C.;Salvaterra G.;Beutier T.;Mangeret R.;Marinoni M.;Miller F.;Ferlet-Cavrois V.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Charge collection;
- PIGST;
- Power MOSFET;
- SEGR/SEB;
20.Evaluation on protective single event burnout test method for power DMOSFETs

机译：功率DMOSFET保护性单事件熔断测试方法的评估
- 作者：Liu Sandra;Marec Ronan;Sherman Phillip;Titus Jeffrey L.;Bezerra Francoise;Ferlet-Cavrois Veronique;Marin Marc;Sukhaseum Nicolas;Widmer Fabien;Muschitiello Michele;Gouyet Lionel;Ecoffet Robert;Zafrani Max
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Nondestructive;
- Power MOSFET;
- Single Event Burnout;
- Test Method;
21.Influence of beam conditions and energy for SEE testing

机译：光束条件和能量对SEE测试的影响
- 作者：Ferlet-Cavrois V.;Schwank J. R.;Liu S.;Muschitiello M.;Beutier Th.;Javanainen A.;Hedlund A.;Poivey C.;Zadeh A.;Harboe-Sorensen R.;Santin G.;Nickson B.;Menicucci A.;Binois C.;Peyre D.;Hoeffgen S. K.;Metzger S.;Schardt D.;Kettunen H.;Virt
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Power MOSFETs;
- SRAM;
- ion beam energy;
- specie effect;
22.Real time SEU detection and diagnosis for safety or mission-critical ICs using HASH library-based fault dictionaries

机译：使用基于HASH库的故障字典对安全或关键任务IC进行实时SEU检测和诊断
- 作者：Mogollon J. M.;Napoles J.;Guzman-Miranda H.;Aguirre M. A.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
23.Investigations of single event effects with heavy ions of energies up to 1.5 GeV

机译：研究重离子能量高达1.5 GeV / n的单事件效应
- 作者：Hoeffgen Stefan K.;Durante Marco;Ferlet-Cavrois Veronique;Harboe-Sorensen Reno;Lennartz Wilhelm;Kuendgen Tobias;Kuhnhenn Jochen;LaTessa Chiara;Mathes Markus;Menicucci Alessandra;Metzger Stefan;Nieminen Petteri;Pleskac Radek;Poivey Christian
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Heavy Ions;
- Single event Effects;
- energy effects;
- indirect ionization;
- nuclear reactions;
24.Temperature effects on power MOSFET and IGBT sensitivities toward single events

机译：温度对功率MOSFET和IGBT对单个事件的敏感性的影响
- 作者：Morand S.;Miller F.;Austin P.;Poirot P.;Gaillard R.;Carriere T.;Buard N.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Burnout;
- IGBT;
- Latch-Up;
- Proton radiation;
- Pulsed Laser Stimulation;
- Temperature;
25.Influence of poly region extended into field oxide on total ionizing dose effect for deep submicron MOSFET

机译：深场亚微米MOSFET中延伸到场氧化物中的多晶硅区域对总电离剂量效应的影响
- 作者：Liu Zhangli;Hu Zhiyuan;Zhang Zhengxuan;Shao Hua;Ning Bingxu;Chen Ming;Bi Dawei;Zou Shichang
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- oxide trapped charge shallow trench isolation;
- three dimension simulation;
- total ionizing dose;
26.Rediscovery of single-event gate rupture mechanism in power MOSFETs

机译：重新发现功率MOSFET中的单事件栅极破裂机制
- 作者：Kuboyama Satoshi;Ikeda Naomi;Mizuta Eiichi;Abe Hiroshi;Hirao Toshio;Tamura Takashi
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Heavy ions;
- power MOSFETs;
- radiation damage;
- single-event effects;
27.Study on the effect of multiple errors in robust systems based on critical task distribution

机译：基于关键任务分配的鲁棒系统中多个错误的影响研究
- 作者：Vaskova Anna;Lopez-ngil Celia;Portela-Garcia Marta;Garcia-Valderas Mario;Entrena Luis;Martin-Ortega Alberto;de Mingo Jose Ramon;Rodriguez Santiago
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Aerospace applications;
- SEU;
- Soft Errors;
- collaborative hardening;
- radiation sensitivity;
28.High ionizing dose effects on ultra thin SiO2/Si structures revealed by Conductive Atomic Force Microscopy

机译：导电原子显微镜显示高电离剂量对超薄SiO 2 / Si结构的影响
- 作者：Arinero R.;Touboul A. D.;Ramonda M.;Guasch C.;Gonzalez-Velo Y.;Boch J.;Saigne F.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
29.Influence of the manufacturing process on the radiation sensitivity of fluorine-doped silica-based optical fibers

机译：制造工艺对掺氟石英基光纤辐射敏感性的影响
- 作者：Alessi A.;Girard S.;Marcandella C.;Vaccaro L.;Cannas M.;Boukenter A.;Ouerdane Y.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Luminescence;
- Optical fibers;
- Optical losses;
- Radiation effects;
30.Calibration of the weighed sensitive volume model to heavy ion experimental data

机译：根据重离子实验数据校准称重的敏感体积模型
- 作者：Garcia Ruben;Daly Eamonn J.;Evans Hugh D. R.;Nieminen Petteri;Santin Giovanni;Sierawski Brian D.;Mendenhall Marcus H.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Weighed sensitive volume;
- charge carrier diffusion;
- charge collection efficiency;
- p-n junction;
- substrate;
31.Single-event vulnerability of mixed-signal circuit interfaces

机译：混合信号电路接口的单事件漏洞
- 作者：Armstrong S. E.;Blaine R. W.;Holman W. T.;Massengill L. W.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
32.Radiation-hardened phase-locked loop fabricated in 200 nm SOI-CMOS

机译：用200 nm SOI-CMOS制成的辐射硬化锁相环
- 作者：Matsuura D.;Hirose K.;Kobayashi D.;Ishii S.;Kusano M.;Kuroda Y.;Saito H.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- phase-locked loop (PLL);
- radiation effects;
- radiation-hardened-by-design (RHBD);
- single-event transient (SET);
33.Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

机译：CMOS 65nm SRAM中Alpha粒子引起的软错误率的地下表征和建模
- 作者：Martinie S.;Autran J.L.;Sauze S.;Munteanu D.;Uznanski S.;Roche P.;Gasiot G.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Alpha emitter;
- Single-Event Rate (SER);
- contamination;
- real-time testing;
- secular equilibrium;
- static memory;
- uranium;
- uranium disintegration chain;
34.Design of a MGy tolerant instrumentation amplifier using a correlated double sampling technique in 130 nm CMOS

机译：使用相关双采样技术在130 nm CMOS中设计MGy耐受仪表放大器
- 作者：Verbeeck Jens;Van Uffelen Marco;Steyaert Michiel S. J.;Leroux Paul
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Analog integrated circuits;
- CMOS technology;
- Pressure gauges;
- Reactor instrumentation;
- Switched capacitor circuits;
35.Efficient multibit Error Correction for memory applications using euclidean geometry codes

机译：使用欧几里德几何代码的存储器应用的高效多位纠错
- 作者：Reviriego Pedro;Flanagan Mark F.;Maestro Juan A.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Euclidean geometry codes;
- Soft errors;
- error correction codes (ECCs);
- memories;
36.Time exceedances for high intensity solar proton fluxes

机译：高强度太阳质子通量的时间限制
- 作者：Xapsos Michael A.;Stauffer Craig A.;Jordan Thomas M.;Adams James H.;Dietrich William F.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- solar particle event;
- time exceedance;
- worst case flux;
37.How to sample results of concurrent error detection schemes in transient fault scenarios?

机译：如何在瞬态故障场景中对并发错误检测方案的结果进行采样？
- 作者：Bastos Rodrigo P.;Di Natale Giorgio;Flottes Marie-Lise;Rouzeyre Bruno
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
38.FTUNSHADES2: A novel platform for early evaluation of robustness against SEE

机译：FTUNSHADES2：一个新颖的平台，可以早期评估针对SEE的鲁棒性
- 作者：Mogollon J.M.;Guzman-Miranda H.;Napoles J.;Barrientos J.;Aguirre M.A.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- FPGA;
- Fault Injection;
- MBU;
- Microprocessors;
- SET;
- SEU;
- Single Event Effects;
39.Electrical performances and radiation qualification tests results of a highly integrated and Space qualified Point of Load Converter

机译：高度集成且经太空认证的负载点转换器的电气性能和辐射鉴定测试结果
- 作者：Vassal Marie-Cecile;Dubus Patrick;Fiant Nicolas
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Point of Load Converter;
- Radiation Hardening test strategy;
40.Assessment and comparison of the low energy proton sensitivity in 65nm to 28nm SRAM devices

机译：评估和比较65nm至28nm SRAM器件中的低能质子灵敏度
- 作者：Weulersse Cecile;Miller Florent;Alexandrescu Dan;Schaefer Erwin;Gaillard Remi
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Direct ionization;
- SRAM;
- proton irradiation;
- single event upset;
41.Temporal sequential logic hardening by design with a low power delay element

机译：通过设计具有低功耗延迟元件的时序时序逻辑强化
- 作者：Shambhulingaiah Sandeep;Clark Lawrence T.;Mozdzen Thomas J.;Hindman Nathan D.;Chella Srivatsan;Holbert Keith E.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Radiation hardening by design;
- flip-flop;
- sequential logic circuits;
- single event transient;
- single event upset;
42.Impact of process variability on the radiation-induced soft error of nanometer-scale srams in hold and read conditions

机译：在保持和读取条件下，工艺可变性对纳米级Sram的辐射诱发的软错误的影响
- 作者：Griffoni Alessio;Zuber Paul;Dobrovolny Petr;Roussel Philippe J.;Linten Dimitri;Alles Michael L.;Schrimpf Ronald D.;Reed Robert A.;Massengill Lloyd W.;Kobayashi Daisuke;Simoen Eddy;Groeseneken Guido
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- CMOS;
- SRAMs;
- Single Event Effect (SEE);
- Single Event Upset (SEU);
- process variability;
- soft error;
43.SET characterization mitigation in 65-nm test structures

机译：65 nm测试结构中的SET表征和缓解
- 作者：Rezgui Sana;Won Raymond;Tien Jonathan;George Jeffrey
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
44.Characterization of bulk damage in CMOS MAPS with deep N-well collecting electrode

机译：带有深N阱集电极的CMOS MAPS中的整体损伤表征
- 作者：Zucca Stefano;Ratti Lodovico;Traversi Gianluca;Bettarini Stefano;Morsani Fabio;Rizzo Giuliana;Bosisio Luciano;Rashevskaya Irina;Cindro Vladimir
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- CMOS MAPS;
- Deep N-well sensor;
- bulk damage;
- charge collection efficiency;
45.Radiation effects on CMOS image sensors with sub-2µm pinned photodiodes

机译：低于2μm的固定光电二极管对CMOS图像传感器的辐射影响
- 作者：Place S.;Carrere J.-P.;Magnan P.;Goiffon V.;Roy F.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- APS;
- CMOS 4T image sensor;
- Irradiation;
- activation energy;
- dark current;
- pinned photodiode;
- temporal noise;
46.Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors

机译：位移损伤剂量对辐照CMOS图像传感器暗电流分布的影响
- 作者：Virmontois C.;Goiffon V.;Magnan P.;Girard S.;Saint-Pe O.;Petit S.;Rolland G.;Bardoux A.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
47.Dose rate radiation induced linear CCD functional failure

机译：剂量率辐射引起的线性CCD功能故障
- 作者：Wang Zujun;Tang Bengqi;Xiao Zhigang;Liu Minbo;Zhang Yong;Huang Shaoyan
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Charge coupled devices;
- Dose rate;
- Functional failure;
- Total dose;
48.Compendium of TID and SEE test results for various candidate spacecraft electronics

机译：各种候选航天器电子设备的TID和SEE测试结果汇总
- 作者：Malou Florence;Dangla David;Rousset Alexandre;Guerre Francois-Xavier
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Component;
- Radiation;
- Spacecraft;
- Testing;
49.A total ionising dose, in-situ test campaign of DS18B20 temperature sensors

机译：DS18B20温度传感器的总电离剂量，原位测试活动
- 作者：Hofman Jiri;Sharp Richard
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- automated test equipment;
- in-situ test;
- intelligent sensors;
- temperature sensors;
- total ionising dose;
50.Second generation (200MHz) RAD750 microprocessor radiation evaluation

机译：第二代（200MHz）RAD750微处理器辐射评估
- 作者：Haddad Nadim F.;Brown Ronald D.;Ferguson Richard;Kelly Andrew T.;Lawrence Reed K.;Pirkl Daniel M.;Rodgers John C.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Ion Radiation Effects;
- Microprocessor;
- Radiation Effects;
- Radiation Hardening;
- Space Technology;
51.Radiation hardness evaluation of a 0.25 µm SiGe BiCMOS technology with LDMOS module

机译：带有LDMOS模块的0.25 µm SiGe BiCMOS技术的辐射硬度评估
- 作者：Teply Florian E.;Venkitachalam Dinesh;Sorge Roland;Scholz Rene F.;Heyer Heinz-Volker;Ullan Miguel;Diez Sergio;Faccio Federico
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- BiCMOS;
- CMOS;
- ESCC evaluation;
- Heterojunction bipolar transistors;
- LDMOS;
- SiGe;
- millimeter wave bipolar integrated circuits;
52.SEE transient response of Crane Electronics Single Output Point of Load DC-DC Converters

机译：起重机电子产品单输出负载点DC-DC转换器的SEE瞬态响应
- 作者：Sanders Anthony B.;Chen Dakai;Kim Hak S.;Phan Anthony M.;Nkei Bertrand;Kristjansson Stefan
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
53.Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity

机译：模拟氢对剂量率敏感性机制的影响
- 作者：Esqueda Ivan. S.;Barnaby Hugh. J.;Adell Philippe C.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Dose rate;
- ELDRS;
- bipolar;
- hydrogen;
- interface traps;
- metal-oxide-semiconductor (MOS);
- silicon dioxide;
- total ionizing dose (TID);
54.A single-event-hardened CMOS operational amplifier design

机译：单事件硬化CMOS运算放大器设计
- 作者：Blaine Raymond W.;Atkinson Nicholas M.;Kauppila Jeffrey S.;Armstrong Sarah E.;Holman W. Timothy;Massengill Lloyd W.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
55.Constrained placement methodology for reducing SER under single-event-induced charge sharing effects

机译：在单事件诱导的电荷共享效应下降低SER的受限放置方法
- 作者：Entrena Luis;Lindoso Almudena;Millan Enrique San;Pagliarini Samuel;Kastensmidt Fernanda
- 会议名称：《》 | 2011年
- SER;
- Single-Event-Induced Charge Sharing;
- fault injection;
- placement;
56.Terrestrial neutron-induced single-event burnout in SiC power diodes

机译：SiC功率二极管中的中子引起的单事件燃尽
- 作者：Asai Hiroaki;Sugimoto Kenji;Nashiyama Isamu;Iide Yoshiya;Shiba Kensuke;Matsuda Mieko;Miyazaki Yoshio
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Power Devices;
- Silicon Carbide (SiC);
- Single Event Burnout;
- Terrestrial Neutron;
57.Combined use of heavy ion and proton test data in the determination of a GaAs Power MESFET critical charge and sensitive depth

机译：结合使用重离子和质子测试数据确定GaAs功率MESFET临界电荷和敏感深度
- 作者：Garcia Ruben;Daly Eamonn J.;Evans Hugh D. R.;Nieminen Petteri;Santin Giovanni;Sierawski Brian D.;Mendenhall Marcus H.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- LET threshold;
- Monte Carlo simulation;
- Single event effect (SEE);
- critical charge;
- direct ionization;
- indirect ionization;
58.Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI

机译：在150 nm 3D SOI中固定体电路与浮体电路的单事件瞬态特性
- 作者：Gaspard N. J.;Ahlbin J. R.;Gouker P. M.;Atkinson N. M.;Gadlage M. J.;Witulski A. F.;Holman W. T.;Bhuva B. L.;Zhang E. X.;Massengill L. W.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- 3DSOI;
- body tie;
- floating body;
- heavy ion;
- single-event transient;
59.SET susceptibility analysis in buffered tree clock distribution networks

机译：缓冲树时钟分配网络中的SET敏感性分析
- 作者：Chipana Raul;Kastensmidt Fernanda Lima;Tonfat Jorge;Reis Ricardo;Guthaus Matthew
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Clock Network;
- Radiation effects;
- SET;
- extraction of clock tree;
60.Single event effects in the high-input voltage DC/DC converter for aerospace applications

机译：用于航空航天应用的高输入电压DC / DC转换器中的单事件效应
- 作者：Wenyan Wang;Qingkui Yu;Meng Meng;Pengwei Li;Min Tang
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- DC/DC converter;
- High-input voltage;
- single-event function failure;
- single-event transient;
61.Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier

机译：典型电流反馈放大器中TID引起的不稳定退化和电路效应
- 作者：Perez S.;Dusseau L.;Velo Y. Gonzalez;Vaille J-R.;Boch J.;Saigne F.;Bezerra F.;Ecoffet R.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- sup60/supCo;
- Current feedback amplifier;
- Total Ionizing Dose;
- bipolar ICs;
- current conveyor;
62.Radiation hardness of two-dimensional focal plane detector arrays for LWIR/VLWIR space sounding missions

机译：用于LWIR / VLWIR空间探测任务的二维焦平面探测器阵列的辐射硬度
- 作者：Weber A.;Belzner W.;Haas L.-D.;Hanna S.;Hofmann K.;Neef A.;Reder M.;Stifter P.;Wendler J.;Ziegler J.;Nothaft H.-P.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- gamma;
- heavy ion;
- infrared image sensors;
- proton;
- radiation effects;
- single event effects;
63.Simulation of Total Ionising Dose on LDMOS devices for High Energy Physics applications

机译：用于高能物理应用的LDMOS器件上总电离剂量的仿真
- 作者：Fernandez-Martinez P.;Palomo F.R.;Diez S.;Hidalgo S.;Ullan M.;Flores D.;Sorge R.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Fixed Oxide Charge;
- Interface Traps;
- LDMOS power devices;
- TCAD Simulation;
- Total Ionising Dose (TID);
64.Validation of the component degradation simulation tool (CODES)

机译：验证组件退化仿真工具（CODES）
- 作者：Keating A.;Goncalves P.;Zadeh A.;Pimenta M.;Coutinho S.;Brogueira P.;Daly E.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- CODES;
- Geant4;
- Radiation;
- Reference SEU Monitor;
- SVFIT;
- Single event effects;
65.Gamma Irradiation of COTS magneto resistive sensors

机译：COTS磁阻传感器的伽马辐射
- 作者：Fernandez A. B.;Sanz R.;Dominguez J. A.;Martin B.;Michelena M. D.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Gamma ray effects;
- Magnetic sensors;
- Space technology;
66.Effect of carrier transport in oxides surrounding active devices on SEE in 45nm SOI SRAM

机译：有源器件周围氧化物中的载流子传输对45nm SOI SRAM中的SEE的影响
- 作者：Turowski Marek;Raman Ashok;Alles Michael L.;Ball Dennis;King Michael P.;Reed Robert A.;Schrimpf Ron D.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- 3D;
- SiOinf2/inf carrier transport;
- Silicon-on-Insulator (SOI);
- TCAD;
- mixed-mode simulation;
- modeling;
- radiation response;
- single-event upset (SEU);
67.Neuton-induced Multiple Bit Upsets on dynamically-stressed commercial SRAM arrays

机译：动态应力的商用SRAM阵列上中子引起的多位不安
- 作者：Rech P.;Galliere J-M.;Girard P.;Griffoni A.;Boch J.;Wrobel F.;Saigne F.;Dilillo L.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Multiple Bit Upset;
- SRAM;
- Soft Error Rate;
68.Single Event Effects of commercial and Hardened by design SRAM

机译：商业化和设计硬化的单事件效果
- 作者：Milliken Peter;Dumitru Radu;Hafer Craig;Wu Tzu-Wen;Rominger Rob;Bruno Kevin;Farris Teresa
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
69.Radiation performance of a monolithic synchronous DC-DC point of load regulator for harsh environments

机译：负载同步稳压器的单片同步DC-DC点的辐射性能，适用于恶劣环境
- 作者：Parkhurst Charles;Torres Hector;Hamlyn Mark;Acosta Julio;Salzman James F.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- DC-DC power converters;
- heavy ions;
- modeling;
- radiation hardening;
- single event transients;
70.Characterization of the neutron induced single event upset in SRAM around high megavoltage clinical accelerators

机译：中子诱发的高兆伏临床加速器周围SRAM中的单事件扰动的特征
- 作者：Jimenez-Ortega Elisa;Exposito Maite R.;Gonzalez-Soto Xesus;Terron Jose A.;Gomez Faustino;Sánchez-Doblado Francisco
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Linear Accelerator;
- Photoneutron;
- SRAM;
- Single Event Upset;
71.SEU Threshold model and its experimental verification

机译：SEU阈值模型及其实验验证
- 作者：Palomo F.R.;Mogollon J.M.;Morilla Y.;Garcia-Lopez J.;Jimenez-Ramos M.C.;Labrador J.A.;Cortes-Giraldo M.A.;Quesada J.M.;Aguirre M.A.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- Low energy accelerators;
- SEU;
- Spice;
- TCAD;
72.Impact of reference voltage on the ELDRS characteristics of the LM4050 shunt voltage reference

机译：参考电压对LM4050分流参考电压的ELDRS特性的影响
- 作者：Kruckmeyer Kirby;Trinh Thang;McGee Larry;Kelly Andrew T.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
73.Local laser irradiation technique for SEE testing of ICs

机译：用于IC的SEE测试的局部激光照射技术
- 作者：Chumakov Alexander I.;Pechenkin Alexander A.;Savchenkov Dmitry V.;Tararaksin Alexander S.;Vasilev Alexey L.;Yanenko Andrey V.
- 会议名称：《12th European Conference on Radiation and Its Effects on Components and Systems》 | 2011年
- measurement by laser beam;
- radiation effects;
- very large scale integration;