Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier

机译：典型电流反馈放大器中TID引起的不稳定退化和电路效应

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The impact of Total Ionizing Dose on a typical current feedback amplifier, the AD844 irradiated with ⁶⁰Co source is investigated. The positive input current and the output voltage present an erratic behavior, that may differ from sample to sample. Circuit analysis is conducted in order to determine the degradation mechanisms.

机译：研究了总电离剂量对典型电流反馈放大器^{60 Co源辐照的AD844的影响。正输入电流和输出电压呈现出不稳定的行为，可能因样品而异。进行电路分析以确定降级机理。}

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来源
《12th European Conference on Radiation and Its Effects on Components and Systems》|2011年|p.270-273|共4页
会议地点 Sevilla(ES)
作者
Perez S.; Dusseau L.; Velo Y. Gonzalez; Vaille J-R.; Boch J.; Saigne F.; Bezerra F.; Ecoffet R.;
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原文格式 PDF
正文语种 eng
中图分类无线电技术;
关键词
sup60/supCo; Current feedback amplifier; Total Ionizing Dose; bipolar ICs; current conveyor;

机译：^{60 Co；电流反馈放大器；总电离剂量；双极IC；电流传送器;}

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4. Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier [C] . Perez S., Dusseau L., Velo Y. Gonzalez, European Conference on Radiation and its Effects on Components and Systems . 2011

机译：典型电流反馈放大器中TID引起的不稳定劣化和电路效果
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Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier

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