首页> 外国专利> Device for acquiring pulse height spectrum, method for acquiring pulse height spectrum, program for acquiring pulse height spectrum, and radiation imaging apparatus

Device for acquiring pulse height spectrum, method for acquiring pulse height spectrum, program for acquiring pulse height spectrum, and radiation imaging apparatus

机译:获取脉冲高度谱的装置,获取脉冲高度谱的方法,获取脉冲高度谱的程序,以及辐射成像装置

摘要

A highly accurate pulse height spectrum is generated within a short amount of time, further cost of a radiation imaging apparatus being reduced by employing a detector that performs calibration using the pulse height spectrum. Provided is a pulse height spectrum acquisition device of a radiation detector including multiple counting units for counting a detected signal obtained by detecting incident X-rays, when a value of the detected signal is equal to or larger than a threshold, and for outputting a count value of each counting unit. This device is provided with a threshold setter configured to set to a first counting unit, a first threshold V1 as a threshold for a first measurement, along with setting to a second counting unit, a second threshold V2 larger than the first threshold V1, and to set to the first counting unit, a reconfigured threshold V1′ as the threshold for a second measurement, the reconfigured threshold V1′ being different from the first threshold V1, a measurement controller configured to perform multiple measurements, and a pulse height spectrum generator configured to generate a pulse height spectrum for the first threshold V1 of the first counting unit, on the basis of a difference in the count values from the first counting unit and the second counting unit, obtained by the multiple measurements performed by the measurement controller.
机译:通过采用使用脉冲高度谱执行校准的检测器,在短时间内产生高度精确的脉冲高度谱,进一步成本降低了辐射成像装置。提供了一种辐射检测器的脉冲高度频谱采集装置,包括多个计数单元,用于计数通过检测到入射X射线获得的检测信号,当检测到的信号的值等于或大于阈值时,并且用于输出计数每个计数单元的值。该设备具有被配置为设置为第一计数单元的阈值设置器,第一阈值V1作为第一测量的阈值,以及设置为第二计数单元,第二阈值V2大于第一阈值V1,以及要设置到第一计数单元,重新配置阈值V1'作为第二测量的阈值,重新配置阈值V1'与第一阈值V1不同,被配置为执行多个测量的测量控制器,以及配置的脉冲高度谱发生器基于由由测量控制器执行的多个测量值获得的来自第一计数单元和第二计数单元的计数值的差异来生成第一计数单元的第一阈值V1的脉冲高度频谱。

著录项

  • 公开/公告号US11045153B2

    专利类型

  • 公开/公告日2021-06-29

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号US201816628253

  • 发明设计人 ISAO TAKAHASHI;

    申请日2018-05-23

  • 分类号A61B6/03;G01T1/36;A61B6;G01T1/15;

  • 国家 US

  • 入库时间 2022-08-24 19:39:43

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