首页> 外国专利> DEVICE FOR ACQUIRING WAVE HEIGHT FREQUENCY DISTRIBUTION, METHOD FOR ACQUIRING WAVE HEIGHT FREQUENCY DISTRIBUTION, PROGRAM FOR ACQUIRING WAVE HEIGHT FREQUENCY DISTRIBUTION, AND RADIATION IMAGE CAPTURING DEVICE

DEVICE FOR ACQUIRING WAVE HEIGHT FREQUENCY DISTRIBUTION, METHOD FOR ACQUIRING WAVE HEIGHT FREQUENCY DISTRIBUTION, PROGRAM FOR ACQUIRING WAVE HEIGHT FREQUENCY DISTRIBUTION, AND RADIATION IMAGE CAPTURING DEVICE

机译:用于获取波高频率分布的装置,用于获取波高频率分布的方法,用于获取波高频率分布的程序以及辐射图像捕获设备

摘要

The present invention creates a wave height frequency distribution at high accuracy within a short time, and also reduces the cost of a radiation image capturing device to which a detector for performing correction by using the wave height frequency distribution is applied. Provided is a device for acquiring a wave height frequency distribution of a radiation detector, which is provided with a plurality of counting units that count a detection signal for detecting an incident x-ray when a value of the detection signal is a threshold value or higher, and that output the counted value. The device is provided with: a threshold value setting unit which sets a first threshold value V1 for a first counting unit, sets a second threshold value V2 higher than the first threshold value V1 for a second counting unit, and resets another first threshold value V1' different from the first threshold value V1 for the first counting unit; a measurement control unit which performs a plurality of measurements; and a wave height frequency distribution generation unit which generates a wave height frequency distribution for the first threshold value in the first counting unit on the basis of a difference between counting values of the first counting unit and the second counting unit that are obtained by the plurality of measurements performed by the measurement control unit.
机译:本发明在短时间内以高精度产生波高频率分布,并且还降低了放射线图像捕获装置的成本,该放射线图像捕获装置应用了通过使用波高频率分布进行校正的检测器。提供了一种用于获取放射线检测器的波高频率分布的装置,该装置设置有多个计数单元,当检测信号的值为阈值或更高时,该多个计数单元对用于检测入射x射线的检测信号进行计数。 ,然后输出计数值。该设备具有:阈值设置单元,其为第一计数单元设置第一阈值V1,为第二计数单元设置高于第二阈值V1的第二阈值V2,并重置另一个第一阈值V1与第一计数单元的第一阈值V1不同;测量控制单元执行多个测量;波高频率分布产生单元,基于由多个获得的第一计数单元和第二计数单元的计数值之差,在第一计数单元中产生第一阈值的波高频率分布由测量控制单元执行的测量。

著录项

  • 公开/公告号WO2019017069A1

    专利类型

  • 公开/公告日2019-01-24

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号WO2018JP19814

  • 发明设计人 TAKAHASHI ISAO;

    申请日2018-05-23

  • 分类号G01T1/36;A61B6/03;G01T1/17;

  • 国家 WO

  • 入库时间 2022-08-21 11:57:16

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