首页> 外国专利> METHOD AND SYSTEM FOR DETERMINING THE SEPARATION DISTANCE BETWEEN A BODY AND THE SURFACE OF AN OBJECT BY MEANS OF LOW COHERENCE OPTICAL INTERFEROMETRY TECHNIQUES UNDER DISTORTION DUE TO SUB-SAMPLING

METHOD AND SYSTEM FOR DETERMINING THE SEPARATION DISTANCE BETWEEN A BODY AND THE SURFACE OF AN OBJECT BY MEANS OF LOW COHERENCE OPTICAL INTERFEROMETRY TECHNIQUES UNDER DISTORTION DUE TO SUB-SAMPLING

机译:通过低相干光学干涉技术在子采样下的低相干光学干涉测量技术确定体内和物体表面之间的分离距离的方法和系统

摘要

A method and a system are described for determining the separation distance between an object or a material and a processing tool or an instrument for measuring the object or material, comprising:- generating a measurement low coherence optical radiation beam, leading the measurement beam towards the object and leading the reflected or diffused measurement beam from the object towards an optical interferometric sensor arrangement in a first direction of incidence,- generating a reference low coherence optical radiation beam, and leading the reference beam towards the optical interferometric sensor means in a second direction of incidence at a preset angle of incidence with respect to the first direction of incidence of the measurement beam;- superimposing the measurement beam and the reference beam on a common region of incidence of the sensor means;- detecting the position of a pattern of interference fringes between the measurement beam and the reference beam on the region of incidence; and- determining a difference in optical length between the measurement optical path and the reference optical path on the basis of the position of the pattern of interference fringes along an illumination axis of the region of incidence, which is indicative of a difference between (a) the current separation distance between the processing tool or measuring instrument and the surface of the object and (b) the predetermined nominal separation distance,wherein the sensor means comprise an arrangement of photodetectors along the illumination axis, and the angle of incidence is controlled in such a way that the spatial frequency of the pattern of interference fringes is greater than the spatial frequency of the photodetectors.
机译:描述了一种方法和系统,用于确定物体或材料之间的分离距离以及用于测量物体或材料的处理工具或仪器,包括: - 产生测量低相干光辐射束,将测量光束引导到物体上,并在第一入射方向上将反射或扩散测量光束从物体朝向光学干涉传感器布置引导, - 产生参考低相干光辐射束,并在相对于测量光束的第一入射方向的预设的入射角处,将参考光束朝向光学干涉传感器装置朝向光学干涉传感器装置。 - 在传感器装置的公共发生区域上叠加测量光束和参考光束; - 检测在入射区域上测量光束和参考光束之间的干涉条纹的图案的位置;和 - 基于沿着入射区域的照明轴的照明轴的干涉条纹的图案的位置,确定测量光路与参考光路之间的光学长度差异,这表示(a)之间的差异处理工具或测量仪器之间的电流分离距离和物体表面和(B)预定的标称分离距离,其中传感器装置包括沿着照明轴的光电探测器的布置,并且以这样的方式控制入射角,使得干涉条纹图案的空间频率大于光电探测器的空间频率。

著录项

  • 公开/公告号EP3832251A1

    专利类型

  • 公开/公告日2021-06-09

    原文格式PDF

  • 申请/专利权人 ADIGE S.P.A.;

    申请/专利号EP20200211434

  • 申请日2020-12-03

  • 分类号G01B9/02;B23K26/03;

  • 国家 EP

  • 入库时间 2022-08-24 19:15:39

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