STATISTICAL LOGIC TEST SYSTEM HAVING A WEIGHTED RANDOM TEST PATTERN GENERATOR

摘要

A system for testing complex circuitry primarily in large scale integration where a great number of inputs and outputs must be tested and the internal circuitry is inaccessible. The test system has a weighted random number generator which applies a test signal to some input terminals of the logic under test more frequently than others. A particular input terminal to the logic under test can be accessed in proportion to the circuit switching activity associated with accessing that particular terminal.