首页> 外国专利> METHOD FOR MEASURING SPATIAL HOMOGENITY FOR OPTIMIZATION OF MATERIALS AND TECHNOLOGIES, E. G. FOR DETECTION AND ELIMINATION RESP. TECHNOLOGICAL COMPENSATION OF SOIL SPOTS DISTURBING OF FIELD GROWING OF PLANTS, AS WELL AS MACHINE COORDINATION CONTROLLING PROCESS, ADAPTED TO IT

METHOD FOR MEASURING SPATIAL HOMOGENITY FOR OPTIMIZATION OF MATERIALS AND TECHNOLOGIES, E. G. FOR DETECTION AND ELIMINATION RESP. TECHNOLOGICAL COMPENSATION OF SOIL SPOTS DISTURBING OF FIELD GROWING OF PLANTS, AS WELL AS MACHINE COORDINATION CONTROLLING PROCESS, ADAPTED TO IT

机译：测量材料均质性以优化材料和技术的方法，例如用于检测和消除残留物。适应于植物生长的土壤点扰动的技术补偿及其适应的机械协调控制过程

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公开/公告号HUT49278A

专利类型
公开/公告日1989-09-28

原文格式PDF
申请/专利权人 TEJFALUSSYANDRASHU;
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申请/专利号HU19880001095
发明设计人 TEJFALUSSYANDRASHU;
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申请日1988-03-07
分类号A01G1/00;A01G9/00;G01B7/32;
国家 HU
入库时间 2022-08-22 06:39:10

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