首页> 外国专利> METHOD OF ESTIMATING CRITICAL CURRENT DENSITY AND CRITICAL CURRENT DENSITY DISTRIBUTION OF OXIDE SUPERCONDUCTOR BY USE OF INDUCTION COIL

METHOD OF ESTIMATING CRITICAL CURRENT DENSITY AND CRITICAL CURRENT DENSITY DISTRIBUTION OF OXIDE SUPERCONDUCTOR BY USE OF INDUCTION COIL

机译:用感应线圈估算氧化物超导体的临界电流密度和临界电流密度分布的方法。

摘要

PURPOSE:To easily estimate the critical current density and critical current density distribution of the oxide superconductor without cooling the oxide superconductor to put the conductor into a superconducting state by measuring the inductance of an induction coil in the normal conducting temp. above the critical temp. CONSTITUTION:The annular induction coil 2 is installed in the sky above the surface of the plate oxide superconductor 1 in such a manner that the coil plane thereof is paralleled with the surface of the superconductor 1. The inductance of the induction coil 2 is then measured in the normal conducting temp. above the critical temp. The resistance value at the measurement point of the superconductor 1 in the normal conducting temp. is determined in accordance with the measured inductance. The critical current temp. and critical current distribution of the superconductor 1 are estimated from this resistance value.
机译:目的:通过在正常导电温度下测量感应线圈的电感,无需冷却氧化物超导体即可使导体进入超导状态,从而轻松估算氧化物超导体的临界电流密度和临界电流密度分布。高于临界温度组成:环形感应线圈2安装在板状氧化物超导体1表面上方的天空中,其线圈平面与超导体1的表面平行。然后测量感应线圈2的电感在正常的传导温度下高于临界温度在正常导电温度下,超导体1的测量点处的电阻值。根据测得的电感确定。临界电流温度从该电阻值推定超导体1的临界电流分布。

著录项

  • 公开/公告号JPH02201171A

    专利类型

  • 公开/公告日1990-08-09

    原文格式PDF

  • 申请/专利权人 FURUKAWA ELECTRIC CO LTD:THE;

    申请/专利号JP19890020561

  • 发明设计人 MATSUBA HIRONORI;YAHARA AKITO;

    申请日1989-01-30

  • 分类号G01R27/02;

  • 国家 JP

  • 入库时间 2022-08-22 06:24:05

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