首页> 外国专利> Fine structure formation appts. - for plasma etching of substrates or layers comprising vacuum chamber, gas supply, plasma generator, holder, etc.

Fine structure formation appts. - for plasma etching of substrates or layers comprising vacuum chamber, gas supply, plasma generator, holder, etc.

机译:精细的结构形成。 -用于等离子体蚀刻包括真空室,气体供应,等离子体发生器,支架等的基板或层。

摘要

Appts. for forming a fine structure comprises a vacuum chamber (1), a reactive gas supply (8), a plasma generator (3), a specimen holder (4) which acts as an electrode and which is coupled to the plasma generator (3), an elastic wave generating holder (4), and a device (7) for evacuating the vacuum chamber. The appts. may also have a counter-electrode (6) located opposite the specimen holder (4). A fine structuring process, employing the appts., is also claimed. USE/ADVANTAGE - The appts. and process are useful for (electron cyclotron) plasma etching, (magnetic field assisted) reactive ion etching, neutral beam etching, light-activated or light-assisted etching or physical ion etching of semiconductor substrates, magnetic tapes or discs, video discs, metal articles, machine elements or layers of silicon (cpds.), metal (cpds.), organic polymer (e.g. novolac resin or polyimide), ferroelectric materials (e.g. PZT), (oxide) superconductor materials or ferromagnetic materials. Excellent fine structures are formed without redn. in etching pressure and rate. (9pp Dwg.No.1/5)
机译:Appts。用于形成精细结构的装置包括真空室(1),反应气体源(8),等离子体发生器(3),用作电极并耦合到等离子体发生器(3)的样品架(4) ,弹性波产生保持器(4)和用于抽真空室的装置(7)。苹果。在样品架(4)的对面还可以有一个反电极(6)。还要求一种利用所述装置的精细构造方法。使用/优势-应用程序。本发明的方法和方法可用于半导体基板,磁带或光盘,录像带,金属的(电子回旋加速器)等离子体蚀刻,(磁场辅助)反应离子蚀刻,中性束蚀刻,光激活或光辅助蚀刻或物理离子蚀刻。制品,机器元件或硅(cpds。),金属(cpds。),有机聚合物(例如线型酚醛树脂或聚酰亚胺),铁电材料(例如PZT),(氧化物)超导体材料或铁磁材料或层。形成优良的精细结构而不会变红。在蚀刻压力和速率。 (9pp载重号1/5)

著录项

  • 公开/公告号DE4128780A1

    专利类型

  • 公开/公告日1992-03-05

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI K.K. TOKIO/TOKYO JP;

    申请/专利号DE19914128780

  • 发明设计人 YONEDA MASAHIRO ITAMI HYOGO JP;

    申请日1991-08-29

  • 分类号C23F4/00;H01L21/308;C23C14/34;

  • 国家 DE

  • 入库时间 2022-08-22 05:25:32

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