Device for the characterization of a dielectric of samples of material of the surface is planar or non-planar application to the non-destructive monitoring of the dielectric of the said sample homogeneity.

摘要

The invention relates to a device for the characterization of samples of dielectric material with a flat surface and / or is not plane, the device comprising a probe (3) connected to a coaxial line (2) by a connector (30) and is characterized in that the probe comprises a tubular part of the conductive (7), a conductive rod (8) which is coaxial with the tubular part (7), an annular part (10) made of dielectric material housed in the tubular part (7) and integral with the rod (8), the assembly of the rod (8) and annular part (10) sliding in the tubular part (7) by opposing a resistance when its second end is in contact with the sample (4) in order to ensure a good contact with the latter, this second end having at least one axis which coincides with a generatrix of the surface of the sample so that the contact takes place, that the surface to be planar or non-planar. & br / application to the non-destructive testing of the homogeneity dielectric of samples.