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METHOD FOR DECREASING DISLOCATION OF GAAS SINGLE CRYSTAL BY VERTICAL TEMPERATURE GRADIENT
METHOD FOR DECREASING DISLOCATION OF GAAS SINGLE CRYSTAL BY VERTICAL TEMPERATURE GRADIENT
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机译:垂直温度梯度减小GAAS单晶位错的方法
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摘要
The decreasing method of a dislocation density at GaAs single crystal growth by the vertical temperature gradient method is characterited by (a) inserting a seed into the quartz boat, and then growing the single crystal, (b) decreasing the temperature of the shaft direction from 10 C/cm, (c) changing the corn angle of the boat from 30 degree to 60 degree 90 degree, and (d) removing the support holder to flatten the solid-liquid boundary shape. The method decreases an etch pit density, and inhibits formation of the lineage by the local wetting and generation of the dislocation.
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机译:通过垂直温度梯度法在GaAs单晶生长时降低位错密度的方法的特征在于:(a)将晶种插入石英舟中,然后生长单晶,(b)使轴向温度从10 C / cm,(c)将船的玉米角从30度更改为90度,再到60度,(d)取下支撑架以使固液边界形状变平。该方法降低了蚀刻凹坑密度,并通过局部润湿和位错的产生来抑制谱系的形成。
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