首页> 外国专利> Method for determining the emission wavelength of semiconductor lasers with Fabry-Perot cavity from electrical measurements.

Method for determining the emission wavelength of semiconductor lasers with Fabry-Perot cavity from electrical measurements.

机译:通过电测量确定具有Fabry-Perot腔的半导体激光器的发射波长的方法。

摘要

The lasers being formed on the same semiconductor plate, the lambda1 emission wavelength of one of the lasers is optically determined. The lambda emission wavelength of each other laser is determined by electrical measurements on the current I injected into this laser and the voltage V between its terminals and with the formula lambda = DELTA + 1.24x (V - RxI) - 1 where R is the dynamic resistance of the laser for I greater than the threshold current of the laser. DELTA is determined with this formula applied to the laser whose emission wavelength is lambda1. Application to optical telecommunications.
机译:激光器形成在同一半导体板上,光学地确定其中一个激光器的λ发射波长。彼此激光器的λ发射波长是通过对注入该激光器的电流I及其端子之间的电压V进行电测量来确定的,公式为λ= DELTA + 1.24x(V-RxI)-1其中R为动态I的激光器电阻大于激光器的阈值电流。利用该公式确定Δ,该公式适用于发射波长为λ1的激光器。在光通信中的应用。

著录项

  • 公开/公告号FR2708153A1

    专利类型

  • 公开/公告日1995-01-27

    原文格式PDF

  • 申请/专利权人 IRENE JOINDOT;

    申请/专利号FR19930008956

  • 发明设计人 IRENE JOINDOT;

    申请日1993-07-21

  • 分类号H01S3/13;H01S3/18;

  • 国家 FR

  • 入库时间 2022-08-22 04:07:02

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