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Method and appertaining pair of mask patterns for fabricating, with the application of double masking, integrated optical waveguide structures

机译:利用双重掩膜的集成光波导结构的制造方法及相应的成对掩膜图形

摘要

An alignment-tolerant fabrication of a waveguide structure having a symmetrical component structure and an asymmetrical component structure such as an asymmetrical X junction, with the aid of the technique of double masking is presented. The entire waveguide structure is defined by two different mask patterns (p.sub.1, p.sub.2) which are applied successively and in a mutually overlapping position. The two mask patterns are aligned with respect to one another according to alignment directions parallel (z-axis) and perpendicular (x-axis) to the axis of symmetry of the symmetrical component structure. Each mask pattern comprises a first asymmetrical component pattern (32;35) and a second asymmetrical component pattern (31,33; 34,36). The first component patterns (32 and 35) each define a separate portion of the asymmetrical component structure. The second component patterns ((31,33) and (34,36)) are mirror images of one another and comprise component shapes (33;36) which depend on a predefined alignment accuracy (w.sub.1) in the alignment direction perpendicular (x-axis) to the axis of symmetry.
机译:借助于双重掩膜技术,提出了具有对称分量结构和非对称分量结构(例如非对称X结)的波导结构的耐对准制造。整个波导结构由两个不同的掩模图案(p1,sub.2)限定,两个掩模图案相继施加并且位于相互重叠的位置。根据平行于对称部件结构的对称轴的(z轴)和垂直(x轴)的对准方向,两个掩模图案彼此对准。每个掩模图案包括第一不对称分量图案(32; 35)和第二不对称分量图案(31,33; 34,36)。第一部件图案(32和35)各自限定了不对称部件结构的单独部分。第二部件图案((31,33)和(34,36))是彼此的镜像,并且包括部件形状(33; 36),部件形状(33; 36)取决于在对准方向上的预定对准精度(w.sub.1)。垂直于(x轴)对称轴。

著录项

  • 公开/公告号US5528708A

    专利类型

  • 公开/公告日1996-06-18

    原文格式PDF

  • 申请/专利权人 KONINKLIJKE PTT NEDERLAND N.V.;

    申请/专利号US19950388366

  • 发明设计人 JOHANNES J. G. M. VAN DER TOL;

    申请日1995-02-14

  • 分类号G02B6/125;

  • 国家 US

  • 入库时间 2022-08-22 03:38:22

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