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Magnetron sputtering method and apparatus of the substrate bias method

机译:磁控溅射方法和衬底偏压方法的设备

摘要

PURPOSE:To form a film with superior covering power to the substrate shape by controlling the voltage waveform of bias potential by means of specific conditions and also successively modifying the waveform in a film-forming process. CONSTITUTION:A sputtering device is equipped with a target 109, a sputter electrode 108 in which exciting coils are multiply disposed into an annular state to change the proportion of electric current to be sent to respective coils and also freely change the position of plasma formation, a vacuum tank 101, a sputter electric power source 111, an evacuating means 113, a sputtering gas-introducing means 112, a substrate 102 to be coated with film, and a substrate bias electric power source 120 applying bias potential to the substrate 102. At the time of forming a film by a bias sputtering method by the above constitution, the voltage waveform of bias potential is regulated so that the value obtained by dividing the length of time where the voltage takes the value on the negative side of the temporal average voltage value by the length of time where the voltage takes the value on the positive side of the temporal average value is below '1', and further, the ratio of times or waveform is successively modified in the course of a single film-forming process.
机译:用途:通过在特定条件下控制偏压电位的电压波形,并在成膜过程中连续修改波形,以形成对基材形状具有优异覆盖力的膜。组成:一种溅射装置,配备有靶材109,溅射电极108,在该电极中多个励磁线圈呈环形排列,以改变要发送到各个线圈的电流比例,还可以自由改变等离子体的形成位置,真空罐101,溅射电源111,抽空装置113,溅射气体引入装置112,待涂膜的基板102,以及向基板102施加偏压的基板偏压电源120。在通过具有上述构造的偏压溅射法形成膜时,调节偏压电势的电压波形,使得通过将时间的长度除以时间平均值的负侧的值而获得的值电压取时间平均值正值时的时间长度内的电压值小于“ 1”,并且时间或波形的比率为s在一次成膜过程中进行了成功的修改。

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