SEMICONDUCTOR INTEGRATED CIRCUIT TESTER, TESTING BOARD AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To realize a high-speed test of semiconductor devices. ;SOLUTION: This is a semiconductor integrated circuit tester for testing the operation of each semiconductor device, by dividing a large number of semiconductor devices into a plurality of test groups, and successively supplying a testing signal to the semiconductor devices in each test group. The tester is provided with testing boards 1, which have a large number of mounted IC sockets a11 to amn for fitting semiconductor devices, and clock selection supply means S for performing a changeover of clock signals, supplied from outside in synchronization with a group selection signal for specifying a test group and supplying it to each of the IC sockets a11 to amn.;COPYRIGHT: (C)2003,JPO