WIRING INTERVAL DECISION APPARATUS, AUTOMATIC LAYOUT/ WIRING APPARATUS, RULE CREATING APPARATUS THEREFOR, METHOD OF DETERMINING WIRING INTERVAL IN SEMICONDUCTOR INTEGRATED CIRCUIT, AUTOMATIC LAYOUT/WIRING METHOD, AND RULE CREATING METHOD FOR AUTOMATIC LAYOUT/WIRING METHOD

摘要

PROBLEM TO BE SOLVED: To remarkably improve the quality or yield of a semiconductor integrated circuit at an early stage.;SOLUTION: An information analysis apparatus 4 creates function information indicative of a relation between the yield and wiring interval on the basis of the yield obtained by manufacturing products or samples of semiconductor integrated circuits having different wiring intervals in a factory 1. The information analysis apparatus 4 also determines an optimum wiring interval 6 on the basis of the created function information and threshold information 5 indicative of desired yield. The optimum wiring interval 6 is used in a step of an automatic layout/wiring apparatus.;COPYRIGHT: (C)2003,JPO