首页> 外国专利> Method of filling substrate depressions with silicon oxide by high-density-plasma vapor phase deposition with participation of H2O2 or H2O as reaction gas

Method of filling substrate depressions with silicon oxide by high-density-plasma vapor phase deposition with participation of H2O2 or H2O as reaction gas

机译:通过以H 2 O 2或H 2 O作为反应气体参与的高密度等离子体气相沉积用氧化硅填充衬底凹陷的方法

摘要

A first silicon-containing reaction gas and an oxygen precursor representing a further reaction gas are fed to the reaction chamber and a high-density plasma, preferably above 1016 ions/m3, is produced. Through at least partial substitution of the precursor O2 that is normally used, H2O2 and/or H2O are fed to the reaction chamber in order to further reduce the sputtering effects due to O2 ions during the deposition, which lead to undesirable redepositions of the SiO2 on side walls of the depression.
机译:将第一含硅反应气体和代表另一种反应气体的氧气前体进料到反应室和高密度等离子体中,该等离子体优选高于10 16 离子/ m 3 ,产生。通过至少部分替换通常使用的前体O 2 ,H 2 O 2 和/或H 2 O送入反应室,以进一步降低在沉积过程中由于O 2 离子引起的溅射效应,这会导致SiO 2 沉积在表面上凹陷的侧壁。

著录项

  • 公开/公告号US2003087506A1

    专利类型

  • 公开/公告日2003-05-08

    原文格式PDF

  • 申请/专利权人 KIRCHHOFF MARKUS;

    申请/专利号US20020289117

  • 发明设计人 MARKUS KIRCHHOFF;

    申请日2002-11-06

  • 分类号H01L21/76;

  • 国家 US

  • 入库时间 2022-08-22 00:07:42

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号