首页> 外国专利> Method of manufacturing a floating gate and method of manufacturing a non-volatile semiconductor memory device comprising the same

Method of manufacturing a floating gate and method of manufacturing a non-volatile semiconductor memory device comprising the same

机译:制造浮栅的方法和制造包括该浮栅的非易失性半导体存储器件的方法

摘要

A method of manufacturing a floating gate provides an enhancement for the efficiencies of electron discharge and injection. First, a conductive pattern, constituting the arefloating gateforeon, is formed on a substrate. A first insulation layer is formed on a sidewall of the conductive pattern, and then a second insulation layer is formed at an upper portion of the conductive pattern in ways that each increase the sharpness of an edge portion where the sidewall and upper portions of the conductive pattern meet. Therefore, electron transference from the floating gate to a control gate is facilitated.
机译:制造浮栅的方法提供了电子放电和注入效率的增强。首先,在基板上形成构成浮栅的导电图案。在导电图案的侧壁上形成第一绝缘层,然后在导电图案的上部形成第二绝缘层,其方式分别增加了导电侧壁和上部的边缘部分的清晰度。模式相遇。因此,促进了电子从浮动栅极到控制栅极的转移。

著录项

  • 公开/公告号US2004171217A1

    专利类型

  • 公开/公告日2004-09-02

    原文格式PDF

  • 申请/专利权人 CHUNG JIN-KUK;MOON CHANG-ROK;

    申请/专利号US20040787968

  • 发明设计人 JIN-KUK CHUNG;CHANG-ROK MOON;

    申请日2004-02-27

  • 分类号H01L21/8242;

  • 国家 US

  • 入库时间 2022-08-21 23:21:33

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