首页> 外国专利> Electrode assembly for analysis of metal electroplating solution, comprising self-cleaning mechanism, plating optimization mechanism, and/or voltage limiting mechanism

Electrode assembly for analysis of metal electroplating solution, comprising self-cleaning mechanism, plating optimization mechanism, and/or voltage limiting mechanism

机译:用于分析金属电镀液的电极组件,包括自清洁机制,电镀优化机制和/或电压限制机制

摘要

The present invention relates to an electrode assembly useful for analyzing metal electroplating solutions. Such electrode assembly comprises a measuring electrode, preferably a rotating disc electrode or a microelectrode, and at least one of an in situ cleaning mechanism, a nucleation and metal growth optimization mechanism, and a voltage limiting mechanism. The present invention also relates to usage of such electrode assembly for in situ cleaning of the measuring electrode, nucleation and metal growth optimization, or voltage limitation.
机译:电极组件技术领域本发明涉及用于分析金属电镀液的电极组件。这样的电极组件包括测量电极,优选地是转盘电极或微电极,以及原位清洁机制,成核和金属生长优化机制以及限压机制中的至少一种。本发明还涉及这种电极组件用于原位清洁测量电极,成核和金属生长优化或电压限制的用途。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号