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Duty analysis system for a semiconductor integrated circuit and duty analysis method of the same

机译:半导体集成电路的占空比分析系统及其占空比分析方法

摘要

A system for analyzing a monolithic integrated circuit includes a logic circuit simulator configured to obtain a cell duty of a primitive cell configuring a logic circuit by performing a logic simulation of the logic circuit based on a netlist of the logic circuit and input vectors for the logic circuit, an analog circuit simulator configured to obtain a transistor duty of a transistor that configures a primitive cell by performing an analog simulation of the primitive cell based on a netlist of the analog circuit of the primitive cell and input vectors for the primitive cell, and a synthesis module configured to obtain a synthesized duty of a transistor of the logic circuit by performing a synthesis of the cell and transistor duties.
机译:一种用于分析单片集成电路的系统,包括逻辑电路仿真器,该逻辑电路仿真器被配置为通过基于逻辑电路的网表和逻辑的输入向量执行逻辑电路的逻辑仿真来获取构成逻辑电路的原始单元的单元占空比。电路,模拟电路仿真器,被配置为通过基于原始单元的模拟电路的网表和原始单元的输入向量,通过对原始单元进行模拟仿真,来获得构成原始单元的晶体管的晶体管占空比,以及合成模块,被配置为通过执行单元和晶体管占空比的合成来获得逻辑电路的晶体管的合成占空比。

著录项

  • 公开/公告号US6829752B2

    专利类型

  • 公开/公告日2004-12-07

    原文格式PDF

  • 申请/专利权人 KABUSHIKI KAISHA TOSHIBA;

    申请/专利号US20020259500

  • 发明设计人 HIDEAKI MURAKAMI;

    申请日2002-09-30

  • 分类号G06F175/00;

  • 国家 US

  • 入库时间 2022-08-21 22:18:54

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