METHOD FOR SEARCHING FOR TEST RESPONSE ERROR OF SELF-TEST CIRCUIT AND METHOD FOR EVALUATING DETECTION CAPABILITY OF TEST RESPONSE ERROR

摘要

PROBLEM TO BE SOLVED: To provide a method for mathematically searching for an error by a certain procedure without requiring simulation needing an enormous amount of calculation when an error missed in a test response analyzer is obtained.;SOLUTION: In a test response pattern 104, when the logical value of a bit position (i) is 0, it is replaced with a logical variable di, and when the logical value of a bit position (j) is 1, it is replaced with a logical variable/dj. In this case, "/" means logical inversion. When a compressed data pattern 107 in the test response analyzer is represented by using the logical variables (d), a conditional expression that should be satisfied by the logical variables (d) can be obtained. When solutions other than 'all di are 0' are found by solving it, the respective solutions correspond to error generation patterns in the test response pattern 104.;COPYRIGHT: (C)2006,JPO&NCIPI