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METHOD FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE, SYSTEM FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE, STANDARD CELL LIBRARY, MASK AND SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE
METHOD FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE, SYSTEM FOR ANALYZING LAYOUT OF SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE, STANDARD CELL LIBRARY, MASK AND SEMICONDUCTOR INTEGRATE CIRCUIT DEVICE
Disclosed is a method of analyzing layouts of semiconductor integrated circuit devices. The method includes calculating random fault rates, systematic fault rates, parametric fault rates, and areas of a plurality of layouts of interest; calculating area-based fault rates of the plurality of layouts of interest using the random fault rate, systematic fault rate, parametric fault rate, and area; and selecting layouts of interest to be corrected from among the plurality of layouts of interest using the area-based fault rates of the plurality of layouts of interest.
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