DEVICE, METHOD AND PROGRAM FOR EXTRACTING DEFECTIVE FACTOR, AND RECORDING MEDIUM STORING PROGRAM FOR EXTRACTING DEFECTIVE FACTOR

摘要

PROBLEM TO BE SOLVED: To provide a device for extracting a defective factor, which judges the defective factor of a product in a manufacturing device from a wide view point.;SOLUTION: When a change in feature quantity data is outputted to judge the defective factor of a substrate of an entire electronic component packaging device, data varying in time about one feature quantity are outputted (S21). Next, about one feature quantity, a change in data on one substrate is outputted (S22). Then, about one feature quantity, a change in data on a plurality of substrates is outputted (S23).;COPYRIGHT: (C)2008,JPO&INPIT