METHOD FOR PREDICTING AN IMPACT OF AN AGING BEHAVIOUR OF AN ELECTRICAL ELEMENT AND SIMULATION MODEL FOR SIMULATING SUCH BEHAVIOUR

摘要

A method is provided for predicting an impact of an aging behavior of a connector element, which simulates degradation states caused by aging of the connector element by means of at least one resistor element and a voltage source, as well as a computer program performing the method, a computer readable medium including the computer program, and a simulation model for simulating a degraded connector element.