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ELECTRICAL TESTING DEVICE AND ELECTRICAL TESTING METHOD FOR ELECTRONIC DEVICE

机译:电子设备的电气测试装置和电气测试方法

摘要

PROBLEM TO BE SOLVED: To provide a highly reliable apparatus for electrical test and an electrical testing method.;SOLUTION: The apparatus 1 for electrical test includes a first probe 4 which is to be in electrical contact with an inspection device 11; a second probe 7 electrically connected to the first probe 4 which is to be in electrical contact with an external terminal 13 of a body to be tested 12; a cylinder 5 for housing the first probe 4 and the second probe 7 in which a liquid is made to flow in and out between the first probe 4 and the second probe 7; and a fluid pressure regulator 2 for controlling the fluid pressure in the cylinder 5. The contact force of the first probe 4 with respect to the inspection device 11 and the contact force of the second probe 7 with respect to the external terminal 13 are controlled by the fluid pressure in the cylinder 5.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于电气测试的高度可靠的设备和电气测试方法。解决方案:用于电气测试的设备1包括一个与检测装置11电接触的第一探头4;第二探针7电连接到第一探针4,第二探针7与被测物体12的外部端子13电接触。圆筒5用于容纳第一探针4和第二探针7,在第一探针4和第二探针7之间使液体流入和流出。以及用于控制缸5中的流体压力的流体压力调节器2。第一探针4相对于检查装置11的接触力和第二探针7相对于外部端子13的接触力通过以下方式控制。气缸中的流体压力5 .;版权:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010169526A

    专利类型

  • 公开/公告日2010-08-05

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORP;

    申请/专利号JP20090012108

  • 发明设计人 SEKINO KENTARO;

    申请日2009-01-22

  • 分类号G01R1/067;G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-21 19:03:38

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