TEST PROGRAM DEBUG DEVICE, SEMICONDUCTOR TEST DEVICE, TEST PROGRAM DEBUG METHOD, AND TEST METHOD

摘要

PROBLEM TO BE SOLVED: To solve the problem that it requires an enormous amount of time to execute a test program.;SOLUTION: A test program debug device includes a device under test simulator and a semiconductor testing apparatus simulator. The semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.;COPYRIGHT: (C)2010,JPO&INPIT