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MEDIUM DEFECT INSPECTION DEVICE AND MEDIUM DEFECT INSPECTION METHOD

机译:中等缺陷检查装置和中等缺陷检查方法

摘要

PROBLEM TO BE SOLVED: To provide a defect inspection device inspecting, in particular a defect of a magnetic recording medium where isolated magnetic dots are formed, relating to a recording device recording and playing back information by magnetism.;SOLUTION: The defect inspection device inspecting a defect of the magnetic recording medium comprising the isolated magnetic dots includes: a means fixed to a moving stage and magnetizing the magnetic dots on the magnetic recording medium in one direction by application of a magnetic field; a means controlling intensity of the magnetic field; a means changing a magnetic field incident angle of an applied magnetic field to the surface of the magnetic recording medium; and a means determining the defect of the magnetic recording medium from an output waveform read by a playback head after the magnetic field is applied.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种缺陷检查装置检查,特别是形成隔离的磁性点的磁记录介质的缺陷,该缺陷检查装置与通过磁性记录和回放信息的记录装置有关。包括孤立的磁点的磁记录介质的缺陷包括:固定在移动台上并通过施加磁场沿一个方向磁化磁记录介质上的磁点的装置;控制磁场强度的装置;改变施加的磁场相对于磁记录介质表面的磁场入射角的装置; ;版权;(C)2010,JPO&INPIT;和一种装置,其在施加磁场之后由回放头读取的输出波形确定磁记录介质的缺陷。

著录项

  • 公开/公告号JP2010015620A

    专利类型

  • 公开/公告日2010-01-21

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20080172655

  • 发明设计人 TEGURI HIRONORI;

    申请日2008-07-01

  • 分类号G11B5/84;

  • 国家 JP

  • 入库时间 2022-08-21 19:03:29

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