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INSPECTION METHOD BY ULTRASONIC FLAW DETECTION METHOD AND INSPECTION SYSTEM BY ULTRASONIC FLAW DETECTION METHOD

机译:超声缺陷检测方法的检测方法和超声缺陷检测方法的检测系统

摘要

PROBLEM TO BE SOLVED: To provide a tube inspection method by an ultrasonic flaw detection method which enables the detection of the flaw part of a thin-walled inspection target and capable of measuring even the wall thickness of a normal part, and a tube inspection system by the ultrasonic flaw detection method.;SOLUTION: The inspection system by the ultrasonic flaw detection method is equipped with a probe 10 emitting an ultrasonic wave U and receiving reflected waves I and O, amplifying circuits 214a and 214b for amplifying a receiving signal, a memory 110, an inner surface reflected wave recognizing means 208 for recognizing the reflected wave I from an inner surface, amplifying degree switching means 208, 215 and 216 for lowering the amplifying degrees of the amplifying circuits 214a and 214b so that a receiving signal amplifying value may become below a second threshold value Y when the value amplified by the amplifying circuits 214a and 214b becomes a first threshold value X or above and increasing the amplifying degrees of the amplifying circuits 214a and 214b from a lowered state up to a predetermined time, an outer surface reflected wave recognizing means 208 for recognizing the reflected wave O from an outer surface and a thickness detecting means 111 for detecting the thickness of a wall.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种通过超声波探伤方法进行的试管检查方法,其能够检测薄壁检查对象的缺陷部分并且甚至能够测量正常部分的壁厚,并且提供了试管检查系统解决方案:通过超声波探伤方法的检查系统配备有发射超声波U并接收反射波I和O的探头10,放大电路214a和214b,用于放大接收信号,存储器110,内表面反射波识别装置208,用于从内表面识别反射波I,放大度切换装置208、215和216,用于降低放大电路214a和214b的放大度,从而接收信号放大值当由放大电路214a和214b放大的值变为第一阈值X或a时,第二阈值Y可变得低于第二阈值Y。从降低状态到预定时间使放大电路214a和214b的放大度增大并增加,用于识别来自外表面的反射波O的外表面反射波识别装置208和用于检测该反射率的厚度检测装置111壁厚。;版权:(C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP2010025807A

    专利类型

  • 公开/公告日2010-02-04

    原文格式PDF

  • 申请/专利权人 KANSAI X SEN KK;

    申请/专利号JP20080188754

  • 发明设计人 YASHIMA MINORU;YAMAGAMI SEITA;

    申请日2008-07-22

  • 分类号G01N29/04;G01N29/00;G01B17/02;

  • 国家 JP

  • 入库时间 2022-08-21 19:01:30

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