首页> 外国专利> Method for extracting white area of SEM image and method for calculating feature amount in SEM image

Method for extracting white area of SEM image and method for calculating feature amount in SEM image

机译:SEM图像白区的提取方法及SEM图像中特征量的计算方法

摘要

PPROBLEM TO BE SOLVED: To provide an extraction processing method of a white band region used for forming an outline by using an objective SEM image as a raw image and capable of preventing the extracted white band image from being easily separated even when contrast is low. PSOLUTION: Least squares approximation is applied to each pixel Pij of the raw image by using a template function of the following equation (1) obtained by expressing a pixel value z of a region in the vicinity of the pixel as a function of a position (x, y); whether or not the pixel Pij is located on a ridge of the obtained approximation function is determined; and the image is binarized by allocating a value of 1 or a value of 0 to the pixel Pij according to the determination result. The equation (1) is represented by z=f(x, y). PCOPYRIGHT: (C)2006,JPO&NCIPI
机译:

要解决的问题:提供一种白带区域的提取处理方法,该方法通过使用客观的SEM图像作为原始图像来形成轮廓,并且即使在对比时也能够防止提取的白带图像容易分离。低。

解决方案:通过使用以下等式(1)的模板函数,对原始图像的每个像素Pij进行最小二乘近似,该函数通过将像素附近区域的像素值z表示为位置(x,y);确定像素Pij是否位于所获得的近似函数的脊上;通过根据确定结果为像素Pij分配值1或0将图像二值化。等式(1)由z = f(x,y)表示。

版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4417763B2

    专利类型

  • 公开/公告日2010-02-17

    原文格式PDF

  • 申请/专利权人 大日本印刷株式会社;

    申请/专利号JP20040114657

  • 发明设计人 小林 秀章;

    申请日2004-04-08

  • 分类号H01J37/22;G01B15/04;G01N23/225;G03F1/08;G06T1;G06T5;

  • 国家 JP

  • 入库时间 2022-08-21 18:59:23

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号