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Rapid Screening for Lead Concentration Compliance by X-Ray Fluorescence (XRF) Analysis

机译:通过X射线荧光(XRF)分析快速筛选铅浓度合规性

摘要

A method is provided for screening lead concentration compliance of objects, particularly consumer products such as toys, using x-ray fluorescence (XRF) analysis. The measured intensity ratio of the characteristic Lα and Lβ x-rays of lead provides an indication of whether the lead is located primarily in a coating (e.g., paint) layer on the object, or in a thin or thick bulk material. If the intensity ratio indicates that the lead is located in a coating layer or distributed in a thin bulk material, an areal density of lead is determined from at least one of the characteristic x-ray intensities, and the measured areal density is compared to specified lower and upper limits to determine whether the object is unambiguously compliant, unambiguously non-compliant, or indeterminate.
机译:提供了一种使用X射线荧光(XRF)分析来筛选对象(尤其是诸如玩具之类的消费品)中铅浓度符合性的方法。铅的特征性L α和L β X射线的强度比值可以指示铅是否主要位于涂层(例如油漆)中在物体上,或在薄或厚的散装材料中。如果强度比表明铅位于涂层中或分布在薄的块状材料中,则从特征X射线强度中的至少一种确定铅的面密度,并将测得的面密度与指定的X射线强度进行比较。下限和上限,以确定对象是否明确遵从,明确不遵从或不确定。

著录项

  • 公开/公告号US2010272232A1

    专利类型

  • 公开/公告日2010-10-28

    原文格式PDF

  • 申请/专利权人 JOHN PESCE;LEE GRODZINS;

    申请/专利号US20100766250

  • 发明设计人 LEE GRODZINS;JOHN PESCE;

    申请日2010-04-23

  • 分类号G01N23/223;

  • 国家 US

  • 入库时间 2022-08-21 18:55:42

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