Rapid method and indirect measurement of thickness of polymeric films that do not contain elements that absorb X-rays using X-ray fluorescence spectrometry and energy dispersive (DXRF)

摘要

"Rapid method and indirect measurement of thickness of polymeric films that do not contain elements that absorb X-rays using X-ray fluorescence spectrometry of energy dispersive (EDXRF) ". Invention patent that describes the development of a rapid method and indirect measurement of thickness of polymeric films using X-ray fluorescence spectrometry.In the method are used as the metallic shielding films and is a measure of the attenuation of the emission line of the element of the bulkhead.After the introduction of the attenuation values in a calibration equation previously obtained for that movie, is given its actual thickness.The metallic shielding used were lead, copper and aluminum. The measures showed that the method is fast, these being carried out in 100 seconds during the process of irradiation.The values of correlation coefficients of the analytical curves obtained showed that the technique is promising (r up to 1).The limits of detection achieved (LD ranging from 0.043 to 4.04 109 m) showed values applicable to real samples, particularly those with industrial interest.