首页> 外国专利> HIGH ASPECT RATIO MICROSTRUCTURE AND METHOD OF FABRICATING THE SAME AND HIGH ASPECT RATIO MICROSTRUCTURE ARRAY AND METHOD OF FABRICATING THE SAME

HIGH ASPECT RATIO MICROSTRUCTURE AND METHOD OF FABRICATING THE SAME AND HIGH ASPECT RATIO MICROSTRUCTURE ARRAY AND METHOD OF FABRICATING THE SAME

机译:高长宽比微结构及其制造方法高长宽比微结构及其制造方法

摘要

A method for producing a high-aspect-ratio microstructure includes: a photomask attachment step of attaching a photomask with a pattern groove to one surface of a transparent substrate; a photoresist attachment step of attaching a negative photoresist to one surface of the photomask; an exposure step of irradiating light toward the opposite surface of the transparent substrate from the photomask to cure a portion of the negative photoresist with the light irradiated on the negative photoresist through the pattern groove; and a developing step of removing an uncured portion of the negative photoresist while leaving the cured portion of the negative photoresist as a microstructure. With this method, it is possible to produce the high-aspect-ratio microstructure in an easy and cost-effective manner.
机译:一种用于制造高纵横比的微结构的方法,包括:光掩模附接步骤,其将具有图案凹槽的光掩模附接至透明基板的一个表面;光致抗蚀剂附接步骤,其将负性光致抗蚀剂附接至光掩模的一个表面;曝光步骤,从光掩模向透明基板的相反表面照射光,以使通过图案凹槽照射在负性光刻胶上的光固化负性光刻胶的一部分;显影步骤是除去负型光刻胶的未固化部分,同时使负型光刻胶的固化部分保留为微结构。利用这种方法,可以以容易且成本有效的方式制造高纵横比的微结构。

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