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METHOD FOR MEASURING SURFACE PROPERTY PARAMETERS OF A MATERIAL AND SYSTEM FOR ANALYZING SURFACE PROPERTY PARAMETERS OF A MATERIAL BASED ON THE METHOD
METHOD FOR MEASURING SURFACE PROPERTY PARAMETERS OF A MATERIAL AND SYSTEM FOR ANALYZING SURFACE PROPERTY PARAMETERS OF A MATERIAL BASED ON THE METHOD
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机译:用于测量材料表面特性参数的方法以及基于该方法的材料表面特性参数分析系统
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摘要
A universal method for jointly measuring surface property parameters of a material comprises the following steps: performing saturation processing on a surface of a material to be measured; mixing the material to be measured which has been processed by saturation with an indicating electrolyte solution; after the mixture solution achieves an balance by ion exchange, measuring the balanced concentration values of positive ions of the indicating electrolyte and H+ in the mixture solution; according to the balanced concentration values of positive ions of the indicating electrolyte, calculating surface potential of the material; and according to the surface potential of the material, calculating specific surface area and surface charge density of the material; according to surface charge density of the material, calculating surface electric field intensity; according to surface charge density and specific surface area of the material, calculating total surface charge of the material. The method could accurately measure different kinds of surface potentials under difference conditions. A system for measuring surface property parameters of a material based on the method is also disclosed.
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