METHOD FOR MEASURING SURFACE PROPERTY PARAMETERS OF A MATERIAL AND SYSTEM FOR ANALYZING SURFACE PROPERTY PARAMETERS OF A MATERIAL BASED ON THE METHOD

摘要

A common measurement method for substance surface property parameters comprises the following steps: performing saturation treatment to a surface of a substance to be measured; mixing the saturated substance to be measured with an indicator electrolyte solution; upon the resulted mixture reaching ion exchange equilibrium, measuring equilibrium concentration values of indicator electrolyte positive ion and hydrogen ion in the bulk solution of the mixture; calculating substance surface potential based on the equilibrium concentration value of the indicator electrolyte positive ion; calculating substance specific surface area and substance surface charge density based on the substance surface potential; calculating substance surface electric field strength based on the substance surface charge density; and, calculating substance surface charge quantity based on the substance surface charge density and specific surface area. This method can accurately measure different types of surface potential under various conditions. The present invention also discloses a system for measuring substance surface property parameters using such method.