SEMICONDUCTOR MEMORY DEVICE CAPABLE OF PERFORMING A DISTRIBUTED TEST FOR AN ACTIVE BANK IN A BANK SIMULTANEOUS TEST MODE

摘要

PURPOSE: A semiconductor memory device is provided to measure exact data in a bank simultaneous test by performing an active operation according to each bank group.;CONSTITUTION: A bank group control signal generating unit(60) generates plural bank group control signals in response to a bank division test signal and a bank group information signal in a bank simultaneous test mode. A bank address decoding unit(10) generates an internal bank address signal by decoding a bank address in a normal mode. Plural bank active control units(20A) generate plural bank active signals corresponding to each bank group in response to a bank simultaneous test signal, a corresponding bank group control signal and an internal active command signal in the bank simultaneous test mode. The bank active control unit generates plural bank active signals corresponding to each bank(50) in response to the internal bank address signal and the internal active command signal. A plurality of bank pre-charge control units(30) generates plural bank pre-charge signals corresponding to each bank in response to the internal bank address signal, an internal pre-charge command signal and the bank simultaneous test signal. An RAS active signal generating unit(40) generates a plurality of RAS active signals corresponding to each bank in response to the plural bank active signals and the plural bank pre-charge signals.;COPYRIGHT KIPO 2010