首页> 外国专利> Device for determining focus of optical system on substrate, has detector, which comprises four-quadrant diode, and individual quadrants of four-quadrant diode are interconnected in pairs such that two two-quadrant diodes are formed

Device for determining focus of optical system on substrate, has detector, which comprises four-quadrant diode, and individual quadrants of four-quadrant diode are interconnected in pairs such that two two-quadrant diodes are formed

机译:用于确定光学系统在基板上的焦点的装置,具有检测器,该检测器包括四象限二极管,并且四象限二极管的各个象限成对互连,从而形成两个二象限二极管

摘要

The device (100) has a detector (54), which comprises a four-quadrant diode. The individual quadrants of the four-quadrant diode are interconnected in pairs such that two two-quadrant diodes are formed. An auxiliary light beam (50) meets on the substrate such that it lies on a line, which is not parallel to the x-coordinate direction and y-coordinate direction. An independent claim is included for a method for determining the focus of an optical system on a substrate.
机译:装置(100)具有检测器(54),其包括四象限二极管。四象限二极管的各个象限成对互连,这样就形成了两个二象限二极管。辅助光束(50)在基板上相遇,使得其位于一条直线上,该直线不平行于x坐标方向和y坐标方向。包括关于确定光学系统在基板上的焦点的方法的独立权利要求。

著录项

  • 公开/公告号DE102008044511A1

    专利类型

  • 公开/公告日2010-03-11

    原文格式PDF

  • 申请/专利权人 VISTEC SEMICONDUCTOR SYSTEMS GMBH;

    申请/专利号DE20081044511

  • 发明设计人 HEIDEN MICHAEL;

    申请日2008-09-09

  • 分类号G02B7/28;G02B7/32;G02B27/40;G02B21/24;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:45

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