To-be-examined sample and objective positioning device for photonic force microscope, has sample and objective holders mounted on guiding unit, so that relative positions for receiver and objectives are maintained with respect each other

摘要

The device has a sample holder (13) including a sample receiver (3), and an objective (1) configured and accommodated by an objective holder (11) and for guiding light to an examination region. An additional objective (2) is configured and accommodated by an additional objective holder (12), and provided for monitoring the region. The holders are mounted on a guiding unit (14), so that lateral relative positions for the receiver and the objectives are maintained with respect each other, during displacement of the holders axially along a longitudinal axis of the guiding unit.