首页> 外国专利> SIMULATION DEVICE FOR CHARGED PARTICLE BEAM AMOUNT, IRRADIATION DEVICE OF CHARGED PARTICLE BEAM, SIMULATION METHOD FOR CHARGED PARTICLE BEAM AMOUNT, AND IRRADIATION METHOD OF CHARGE PARTICLE BEAM

SIMULATION DEVICE FOR CHARGED PARTICLE BEAM AMOUNT, IRRADIATION DEVICE OF CHARGED PARTICLE BEAM, SIMULATION METHOD FOR CHARGED PARTICLE BEAM AMOUNT, AND IRRADIATION METHOD OF CHARGE PARTICLE BEAM

机译:带电粒子束的模拟装置,带电粒子束的照射装置,带电粒子束的模拟方法以及带电粒子束的照射方法

摘要

PROBLEM TO BE SOLVED: To provide a simulation device and simulation method for charged particle beam amount, which allow early determination of a dose distribution of charged particle beam with a reduced load on arithmetic processing while suppressing the deterioration of accuracy.;SOLUTION: The simulation device 3 includes: an input unit 31 which receives input of simulation data including material information of an irradiation object X and irradiation information of proton beam B; and an arithmetic unit 33 which determines a dose distribution of the proton beam B within the irradiation object X based on the simulation data received by the input unit 31 and a dose distribution kernel. The arithmetic unit 33 forms a Surface Map from the proton beam B assumed to reach the body surface, breaks down the Surface Map to break down the proton beam B into a plurality of beamlets Ba, and determines the dose distribution of the proton beam B within the irradiation body X based on the simulation data received by the input unit 31 and the plurality of beamlets Ba.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种带电粒子束量的仿真装置和仿真方法,该方法和仿真方法可以在减小运算负荷的同时,抑制精度降低,并尽早确定带电粒子束的剂量分布。装置3包括:输入单元31,其接收包括照射对象X的材料信息和质子束B的照射信息的模拟数据的输入;运算单元33基于由输入单元31接收的模拟数据和剂量分布核确定照射对象X内的质子束B的剂量分布。算术单元33从假定到达身体表面的质子束B形成表面图,分解该表面图以将质子束B分解成多个子束Ba,并且确定质子束B在其内的剂量分布。基于输入单元31接收到的模拟数据和多个子束Ba照射辐照体X。版权所有:(C)2012,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号