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POOR CONTACT MEASURING METHOD AND POOR CONTACT MEASURING DEVICE

机译:接触不良的测量方法和接触不良的测量装置

摘要

PROBLEM TO BE SOLVED: To provide a poor contact measuring method and a poor contact measurement determination device, which can measure existence of a poor contact while a male terminal and female contact are connected to each other.;SOLUTION: Noises at a male terminal 108 side and noises at a female terminal 116 side are detected and compared with each other from the outside of housings 110, 118 of coupler units 100, 101 in a current conduction state, and output showing the difference is attained when a difference exists between the noises at the male terminal 108 side and the noises at the female terminal 116 side.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种不良的接触测量方法和不良的接触测量确定装置,其能够在公端子和母接触彼此连接时测量存在的不良接触。;解决方案:公端子108的噪声在电流导通状态下,从耦合器单元100、101的壳体110、118的外部检测并比较阴端子116侧的噪声并相互比较,并在噪声之间存在差异时获得表示该差异的输出阳端子108一侧的噪声,阴端子116一侧的噪声。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011054522A

    专利类型

  • 公开/公告日2011-03-17

    原文格式PDF

  • 申请/专利权人 HONDA MOTOR CO LTD;

    申请/专利号JP20090204611

  • 发明设计人 MARUYAMA SUSUMU;

    申请日2009-09-04

  • 分类号H01R43/00;H01R13/46;

  • 国家 JP

  • 入库时间 2022-08-21 18:23:59

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