首页> 外国专利> METHODS AND APPARATUS FOR FORMING MEMORY LINES AND VIAS IN THREE DIMENSIONAL MEMORY ARRAYS USING DUAL DAMASCENE PROCESS AND IMPRINT LITHOGRAPHY

METHODS AND APPARATUS FOR FORMING MEMORY LINES AND VIAS IN THREE DIMENSIONAL MEMORY ARRAYS USING DUAL DAMASCENE PROCESS AND IMPRINT LITHOGRAPHY

机译:使用双Damascene过程和隐式光刻术在三维记忆阵列中形成记忆线和通孔的方法和装置

摘要

The present invention provides systems, apparatus, and methods for forming three dimensional memory arrays using a multi-depth imprint lithography mask and a damascene process. An imprint lithography mask for manufacturing a memory layer in a three dimensional memory is described. The mask includes a translucent material formed with features for making an imprint in a transfer material to be used in a damascene process, the mask having a plurality of imprint depths. At least one imprint depth corresponds to trenches for forming memory lines and at least one depth corresponds to holes for forming vias. Numerous other aspects are disclosed.
机译:本发明提供了使用多深度压印光刻掩模和镶嵌工艺来形成三维存储器阵列的系统,装置和方法。描述了用于在三维存储器中制造存储层的压印光刻掩模。该掩模包括形成有用于在镶嵌工艺中使用的转印材料中形成压印的特征的半透明材料,该掩模具有多个压印深度。至少一个压印深度对应于用于形成存储线的沟槽,并且至少一个深度对应于用于形成通孔的孔。公开了许多其他方面。

著录项

  • 公开/公告号KR20100120117A

    专利类型

  • 公开/公告日2010-11-12

    原文格式PDF

  • 申请/专利权人 SANDISK 3D LLC;

    申请/专利号KR20107013806

  • 发明设计人 SCHEUERLEIN ROY E.;

    申请日2008-12-31

  • 分类号H01L21/8239;H01L21/768;H01L21/28;

  • 国家 KR

  • 入库时间 2022-08-21 17:53:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号