首页> 外国专利> PROBE FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING THE SAME, AND METHOD FOR MANUFACTURING PROBE PROBE FOR AN ELECTRICAL TEST WITH THE MAIN BODY OF A NEEDLE OF A NICKEL-BORON ALLOY, AN ELECTRICAL CONNECTING DEVICE USING THE SAME, AND A PROBE MANUFACTURING METHOD

PROBE FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING THE SAME, AND METHOD FOR MANUFACTURING PROBE PROBE FOR AN ELECTRICAL TEST WITH THE MAIN BODY OF A NEEDLE OF A NICKEL-BORON ALLOY, AN ELECTRICAL CONNECTING DEVICE USING THE SAME, AND A PROBE MANUFACTURING METHOD

机译:电气测试用探针,使用该探针的电连接装置以及制造带有镍硼合金针主体的电气试验用探针的方法,使用该探针的电气连接装置以及探针的制造方法

摘要

PURPOSE: A probe for an electrical test, an electrical connecting device using the same, and a probe manufacturing method are provided to enhance mechanical properties and electrical properties.;CONSTITUTION: An arm unit(36) is expanded from the bottom of a foot unit(34) toward the transverse direction crossing an extension direction. A pedestal part(38) is protruded from the leading end of the arm unit downward. A needle end(40) is protruded downward the pedestal part.;COPYRIGHT KIPO 2011
机译:目的:提供用于电气测试的探针,使用该探针的电气连接装置以及探针的制造方法,以增强机械性能和电气性能。;组成:臂单元(36)从脚单元的底部扩展(34)朝向与延伸方向交叉的横向。底座部分(38)从臂单元的前端向下突出。针头(40)向下突出到底座部分。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110055390A

    专利类型

  • 公开/公告日2011-05-25

    原文格式PDF

  • 申请/专利权人 KABUSHIKI KAISHA NIHON MICRONICS;

    申请/专利号KR20100106866

  • 发明设计人 HIRAKAWA HIDEKI;KAIZUKA SATOSHI;

    申请日2010-10-29

  • 分类号G01R1/067;H01L21/66;G01R3/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:51

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