FAST IMAGE SCANNING METHOD FOR THE OPERATION OF ATOMIC FORCE MICROSCOPE UNDER LIQUID CONDITIONS

摘要

PURPOSE: A fast image scanning method for the operation of an atomic force microscope under liquid conditions is provided to minimize image distortion without an additional device. CONSTITUTION: A force applied to a cantilever is the sum of squeeze-film effects(Fsc) and drag force(Fd) made from intrinsic features of fluid while the cantilever approaches a surface in z-direction. The force applied to the cantilever during sample surface analysis is the sum of a divided force in y axis direction, coquette flow(Fc) generated during scan in y axis direction, and a frictional force(Ff) during surface scanning of a tip of a cantilever end.