PROBLEM TO BE SOLVED: To perform an operation test efficiently in a short time without preparing expected values to the number corresponding to the number of circuits, relative to a semiconductor device equipped with many circuits having the same constitution.;SOLUTION: When digital filters 150a-150c having the same constitution are used as test object circuits, each comparator circuit 160a-160c for comparing an output value at the test time with the expected value is provided respectively to each digital filter 150a-150c, and daisy chain connection between the digital filters and the comparator circuits is performed so that output values from the digital filters 150a and 150b are inputted as expected values of the comparator circuits 160b and 160c corresponding respectively to other digital filters 150b and 150c. When the same test signal is inputted from a BIST controller 180 into each digital filter 150a-150c, existence of an abnormal circuit can be detected based on the comparison result by the comparator circuit 160a-160c.;COPYRIGHT: (C)2006,JPO&NCIPI
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