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Fringe projection system for a probe with intensity modulating element suitable for phase-shift analysis
Fringe projection system for a probe with intensity modulating element suitable for phase-shift analysis
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机译:带有适合于相移分析的强度调制元件的探头的边缘投影系统
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摘要
An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns to project a plurality of fringe sets comprising a structured light pattern.
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