首页> 外国专利> QUANTITATIVE ANALYSIS METHOD FOR MEASURING FLUORESCENCE AMOUNT USING SURFACE PLASMON FIELD-ENHANCED FLUORESCENCE SPECTROSCOPY, QUANTITATIVE ANALYSIS KIT USED THEREFOR, AND ANALYTE DISSOCIATION INHIBITOR

QUANTITATIVE ANALYSIS METHOD FOR MEASURING FLUORESCENCE AMOUNT USING SURFACE PLASMON FIELD-ENHANCED FLUORESCENCE SPECTROSCOPY, QUANTITATIVE ANALYSIS KIT USED THEREFOR, AND ANALYTE DISSOCIATION INHIBITOR

机译:表面等离子体场荧光光谱法测定荧光量的定量分析方法,使用定量定量分析试剂盒和分析物解离抑制剂测定荧光量

摘要

PROBLEM TO BE SOLVED: To provide a quantitative analysis method capable of inhibiting dissociation between a ligand and an analyte and performing a highly sensitive and precise detection with suppressed variation in obtained signals in the quantitative analysis method for measuring the fluorescence amount using surface plasmon field-enhanced fluorescence spectroscopy, a quantitative analysis kit used therefor, and an analyte dissociation inhibitor.;SOLUTION: A quantitative analysis method according to the present invention includes a specific sensor chip, nanostructured particles, and specific third ligands. The quantitative analysis method for an analyte by surface plasmon field-enhanced fluorescence spectroscopy uses a nanostructure formed by fixing a specific second ligand and the third ligand on the nanostructured particle. The quantitative analysis method includes performing predetermined processes.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种定量分析方法,该方法能够抑制配体与分析物之间的解离,并能够在抑制表面信号的定量分析方法中使用获得的信号进行高度灵敏,精确的检测,从而抑制所得信号的变化,增强的荧光光谱,用于其的定量分析试剂盒以及分析物解离抑制剂。解决方案:根据本发明的定量分析方法包括特定的传感器芯片,纳米结构的颗粒和特定的第三配体。通过表面等离子体激元场增强荧光光谱法对分析物进行定量分析的方法使用通过将特定的第二配体和第三配体固定在纳米结构颗粒上而形成的纳米结构。定量分析方法包括执行预定的过程。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013053902A

    专利类型

  • 公开/公告日2013-03-21

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA HOLDINGS INC;

    申请/专利号JP20110191571

  • 发明设计人 KAYA TAKATOSHI;

    申请日2011-09-02

  • 分类号G01N21/64;G01N21/78;

  • 国家 JP

  • 入库时间 2022-08-21 16:59:08

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