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The observation device which observes the structural analysis device

机译:观察结构分析装置的观察装置

摘要

PROBLEM TO BE SOLVED: To provide a structural analysis apparatus for easily enhancing consistency with an experimental result.;SOLUTION: The structural analysis apparatus has an observation device for observing the position of an observation mark which is fixed to an observation object, and a processor for receiving the observation result of the observation device. The processor executes the processes of: virtually dividing the observation object into a plurality of elements and setting a plurality of nodes on the elements; selecting a node corresponding to the position of the observation mark or one node on an element including the position of the observation mark as a specific node; measuring displacement of the observation mark on the basis of the observation result acquired from the observation device; determining the displacement of the specific node corresponding to the observation mark on the basis of the measured displacement of the observation mark; and performing structural analysis of the observation object with the determined displacement of the specific node as a constraint.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种结构分析装置,以容易地增强与实验结果的一致性。解决方案:该结构分析装置具有观察装置,该观察装置用于观察固定在观察对象上的观察标记的位置,并且具有处理器。用于接收观察装置的观察结果。处理器执行以下处理:将观察对象虚拟地划分为多个元素并且在这些元素上设置多个节点;以及选择与观察标记的位置相对应的节点或包括观察标记的位置的元素上的一个节点作为特定节点;根据从观察装置获得的观察结果,测量观察标记的位移。根据测得的观察标记的位移,确定与观察标记对应的特定节点的位移; ;并以确定的特定节点的位移为约束条件对观察对象进行结构分析。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5203100B2

    专利类型

  • 公开/公告日2013-06-05

    原文格式PDF

  • 申请/专利权人 住友重機械工業株式会社;

    申请/专利号JP20080222027

  • 发明设计人 森田 洋;

    申请日2008-08-29

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:11

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