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Method for attenuated total reflection far ultraviolet spectroscopy and an apparatus for measuring concentrations therewith

机译:衰减全反射远紫外光谱的方法及其浓度测量装置

摘要

In far ultraviolet spectroscopy using attenuated total reflection, total reflection light is measured by using evanescent waves of total reflection light. The penetration depth thereof is equal to or larger than 150 nm in a wavelength range in the far ultraviolet range wherein the penetration depth depends on a wavelength of the far ultraviolet light, refractive index of an object to be measured, refractive index of optical material of the probe and incident angle of the far ultraviolet light at an interface between the probe and the object. The attenuated total reflection probe is made of an optical material selected so as to have the penetration depth equal to or higher than 150 nm in far ultraviolet wavelength range, and the probe makes contact with the object to be measured at the interface, and the far ultraviolet light is incident on the interface at incident angle larger than critical angle in the wavelength range so as to have the penetration depth equal to or higher than 150 nm. The total reflection light from the interface is measured, and absorbance of the object to be measured is determined.
机译:在使用衰减全反射的远紫外光谱中,通过使用全反射光的e逝波来测量全反射光。其穿透深度在远紫外范围内的波长范围内等于或大于150nm,其中,穿透深度取决于远紫外光的波长,被测物体的折射率,光学材料的折射率。探测器和远紫外光在探测器与物体之间的界面处的入射角。衰减全反射探头由选择的光学材料制成,以便在远紫外波长范围内具有等于或大于150 nm的穿透深度,并且探头在界面处与待测对象接触,并且紫外线以大于临界角的入射角在波长范围内入射到界面上,以使穿透深度等于或大于150 nm。测量来自界面的全反射光,并确定待测物体的吸光度。

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