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Antireflection layer with subwavelength grating nanostructure and fabricating method for the same

机译:具有亚波长光栅纳米结构的减反射层及其制备方法

摘要

PURPOSE: An antireflection coating with a lattice microstructure which is less than an optical wavelength and a manufacturing method thereof are provided to prepare a microstructure which is less than an anti-reflective optical wavelength and a silicon oxide film on a surface of a silicon film, thereby reducing a surface reflectance. CONSTITUTION: A lattice microstructure(115) which is less than an anti-reflective optical wavelength is formed on an upper side of a silicon film(110). The lattice microstructure which is less than the anti-reflective optical wavelength is arranged in a cycle which is less than an optical wavelength. A surface of the silicon film is oxidized. A silicon oxide film(120) is formed on the upper side of the silicon film including the lattice microstructure which is less than the anti-reflective optical wavelength.
机译:用途:提供一种具有小于光学波长的晶格微结构的减反射涂层及其制造方法,以在硅膜的表面上制备小于抗反射光学波长的微结构和氧化硅膜,从而降低表面反射率。组成:小于抗反射光波长的晶格微结构(115)形成在硅膜(110)的上侧。小于抗反射光波长的晶格微结构以小于光波长的周期排列。硅膜的表面被氧化。在具有小于抗反射光波长的晶格微结构的硅膜的上侧形成氧化硅膜(120)。

著录项

  • 公开/公告号KR101286398B1

    专利类型

  • 公开/公告日2013-07-15

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20110046998

  • 发明设计人 유재수;임정우;송영민;

    申请日2011-05-18

  • 分类号G02B5;G02B1/11;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:51

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